TitleLifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications
Author(s)S. Rein
PublicationBerlin, Springer, 2005.
Description1 online resource (xxvi, 489 p.) : ill. (some col.)
Abstract NoteAnnotation
NotesIncludes bibliographical references and index
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. SEMICONDUCTORS 4. Silicon crystals
Item TypeeBook
Multi-Media Links
Please Click Here for the Online Book
Circulation Data
Accession#  Call#StatusIssued ToReturn Due On Physical Location
I00395     On Shelf