TitleInfrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons
Author(s)Mathias Schubert
PublicationBerlin, Springer, 2004.
Description1 online resource (xi, 193 p.) : ill
Abstract Note"This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed."--Jacket
Contents NoteEllipsometry -- Infrared model dielectric functions -- Polaritons in semiconductor layer structures -- Anisotropic substrates -- Zincblende-structure materials (III-V) -- Wurtzite-structure materials (Group-III nitrides, ZnO) -- Magneto-optic ellipsometry
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. ELLIPSOMETRY 4. LAYER STRUCTURE (SOLIDS)
Item TypeeBook
Multi-Media Links
Please Click Here for the Online Book
Circulation Data
Accession#  Call#StatusIssued ToReturn Due On Physical Location
I00538     On Shelf