Title Electronic Structure of Disordered Alloys, Surfaces and Interfaces Author(s) Turek, Ilja;Drchal, V??clav;Kudrnovsk??, Josef;Sob, Mojm??r;Weinberger, Peter Publication New York, NY, Springer US, 1997. Description XV, 317 p : online resource Abstract Note At present, there is an increasing interest in the prediction of properties of classical and new materials such as substitutional alloys, their surfaces, and metallic or semiconductor multilayers. A detailed understanding based on a thus of the utmost importance for fu?? microscopic, parameter-free approach is ture developments in solid state physics and materials science. The interrela?? tion between electronic and structural properties at surfaces plays a key role for a microscopic understanding of phenomena as diverse as catalysis, corrosion, chemisorption and crystal growth. Remarkable progress has been made in the past 10-15 years in the understand?? ing of behavior of ideal crystals and their surfaces by relating their properties to the underlying electronic structure as determined from the first principles. Similar studies of complex systems like imperfect surfaces, interfaces, and mul?? tilayered structures seem to be accessible by now. Conventional band-structure methods, however, are of limited use because they require an excessive number of atoms per elementary cell, and are not able to account fully for e.g. substitu?? tional disorder and the true semiinfinite geometry of surfaces. Such problems can be solved more appropriately by Green function techniques and multiple scattering formalism ISBN,Price 9781461562559 Keyword(s) 1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. Electronic materials 5. MATERIALS SCIENCE 6. MATHEMATICAL PHYSICS 7. MICROSCOPY 8. Optical and Electronic Materials 9. OPTICAL MATERIALS 10. SOLID STATE PHYSICS 11. SPECTROSCOPY 12. Spectroscopy and Microscopy 13. Theoretical, Mathematical and Computational Physics Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I00572     On Shelf