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| Title | High-Resolution X-Ray Scattering from Thin Films and Multilayers |
| Author(s) | Holy, Vaclav;Pietsch, Ullrich;Baumbach, Tilo |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1999. |
| Description | XI, 258 p. 140 illus : online resource |
| Abstract Note | This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis |
| ISBN,Price | 9783540496250 |
| Keyword(s) | 1. CRYSTALLOGRAPHY
2. Crystallography and Scattering Methods
3. EBOOK
4. EBOOK - SPRINGER
5. LASERS
6. Materials???Surfaces
7. Optics, Lasers, Photonics, Optical Devices
8. PHOTONICS
9. Surfaces and Interfaces, Thin Films
10. THIN FILMS
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| Item Type | eBook |
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Circulation Data
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Call# | Status | Issued To | Return Due On | Physical Location |
| I00930 |
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