Title Critical Phenomena at Surfaces and Interfaces : Evanescent X-Ray and Neutron Scattering Author(s) Dosch, Helmut Publication Berlin, Heidelberg, Springer Berlin Heidelberg, 1992. Description X, 149 p. 31 illus : online resource Abstract Note This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness ISBN,Price 9783540384564 Keyword(s) 1. Characterization and Evaluation of Materials 2. CRYSTALLOGRAPHY 3. Crystallography and Scattering Methods 4. EBOOK 5. EBOOK - SPRINGER 6. LASERS 7. MATERIALS SCIENCE 8. Materials???Surfaces 9. Optics, Lasers, Photonics, Optical Devices 10. PHOTONICS 11. PHYSICAL CHEMISTRY 12. Surfaces and Interfaces, Thin Films 13. THIN FILMS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I02823     On Shelf