Title Quantitative X-Ray Diffractometry Author(s) Zevin, Lev S;Kimmel, Giora;Mureinik, Inez Publication New York, NY, Springer New York, 1995. Description XVII, 372 p : online resource Abstract Note One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers ISBN,Price 9781461395355 Keyword(s) 1. CRYSTALLOGRAPHY 2. Crystallography and Scattering Methods 3. EBOOK 4. EBOOK - SPRINGER Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I03994     On Shelf