| |
| Title | Scanning Electron Microscopy : Physics of Image Formation and Microanalysis |
| Author(s) | Reimer, Ludwig |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1998. |
| Description | XIV, 529 p : online resource |
| Abstract Note | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information |
| ISBN,Price | 9783540389675 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Interfaces (Physical sciences)
4. MICROSCOPY
5. PHYSICS
6. Physics, general
7. SOLID STATE PHYSICS
8. SPECTROSCOPY
9. Spectroscopy and Microscopy
10. Surface and Interface Science, Thin Films
11. Surfaces (Physics)
12. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I04321 |
|
|
On Shelf |
|
|
|
|