TitleIn-situ Materials Characterization : Across Spatial and Temporal Scales
Author(s)Ziegler, Alexander;Graafsma, Heinz;Zhang, Xiao Feng;Frenken, Joost W.M
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 2014.
DescriptionXI, 256 p. 124 illus., 78 illus. in color : online resource
Abstract NoteThe behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction
ISBN,Price9783642451522
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Materials???Surfaces 6. MICROSCOPY 7. Nanoscale science 8. Nanoscale Science and Technology 9. NANOSCIENCE 10. Nanostructures 11. NANOTECHNOLOGY 12. SPECTROSCOPY 13. Spectroscopy and Microscopy 14. Structural Materials 15. Surfaces and Interfaces, Thin Films 16. THIN FILMS
Item TypeeBook
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Accession#  Call#StatusIssued ToReturn Due On Physical Location
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