Title Introduction to Quantum Metrology : Quantum Standards and Instrumentation Author(s) Nawrocki, Waldemar Publication Cham, Springer International Publishing, 2015. Description XIII, 279 p. 134 illus., 23 illus. in color : online resource Abstract Note This book presents the theory of quantum effects used in metrology and results of the author???s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists??and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called?? Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community ISBN,Price 9783319156699 Keyword(s) 1. EBOOK 2. EBOOK - SPRINGER 3. ELECTRONICS 4. Electronics and Microelectronics, Instrumentation 5. Measurement Science and Instrumentation 6. Measurement?????? 7. MICROELECTRONICS 8. Nanoscale science 9. Nanoscale Science and Technology 10. NANOSCIENCE 11. Nanostructures 12. NANOTECHNOLOGY 13. Nanotechnology and Microengineering 14. PHYSICAL MEASUREMENTS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I06449     On Shelf