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Title | Atomic and Nuclear Analytical Methods : XRF, M??ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques |
Author(s) | Verma, Hem Raj |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2007. |
Description | XIV, 376 p. 128 illus : online resource |
Abstract Note | This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), M??ssbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories |
ISBN,Price | 9783540302797 |
Keyword(s) | 1. Analytical chemistry
2. Atomic, Molecular, Optical and Plasma Physics
3. ATOMS
4. Characterization and Evaluation of Materials
5. CONDENSED MATTER
6. CONDENSED MATTER PHYSICS
7. EBOOK
8. EBOOK - SPRINGER
9. MATERIALS SCIENCE
10. Measurement Science and Instrumentation
11. Measurement??????
12. PHYSICAL MEASUREMENTS
13. PHYSICS
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Item Type | eBook |
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Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I07567 |
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