Title Materials and Reliability Handbook for Semiconductor Optical and Electron Devices Author(s) Ueda, Osamu;Pearton, Stephen J Publication New York, NY, Springer New York, 2013. Description XVI, 616 p : online resource Abstract Note Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability.?? Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Provides the first handbook to cover all aspects of compound semiconductor device reliability Systematically describes research results on reliability and materials issues of both optical and electron devices developed since 2000 Covers characterization techniques needed to understand failure mechanisms in compound semiconductor devices Includes experimental approaches in reliability studies Presents case studies of laser degradation and HEMT degradation ISBN,Price 9781461443377 Keyword(s) 1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. ELECTRONIC CIRCUITS 5. Electronic Circuits and Devices 6. Electronic materials 7. ELECTRONICS 8. Electronics and Microelectronics, Instrumentation 9. LASERS 10. MATERIALS SCIENCE 11. MICROELECTRONICS 12. Optical and Electronic Materials 13. OPTICAL MATERIALS 14. Optics, Lasers, Photonics, Optical Devices 15. PHOTONICS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I07917     On Shelf