Title Theoretical Concepts of X-Ray Nanoscale Analysis : Theory and Applications Author(s) Benediktovich, Andrei;Feranchuk, Ilya;Ulyanenkov, Alexander Publication Berlin, Heidelberg, Springer Berlin Heidelberg, 2014. Description XIII, 318 p. 108 illus., 37 illus. in color : online resource Abstract Note This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike ISBN,Price 9783642381775 Keyword(s) 1. Applied and Technical Physics 2. Characterization and Evaluation of Materials 3. EBOOK 4. EBOOK - SPRINGER 5. MATERIALS SCIENCE 6. MATHEMATICAL PHYSICS 7. Measurement Science and Instrumentation 8. Measurement?????? 9. MICROSCOPY 10. PHYSICAL MEASUREMENTS 11. PHYSICS 12. SPECTROSCOPY 13. Spectroscopy and Microscopy 14. Theoretical, Mathematical and Computational Physics Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I08294     On Shelf