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| Title | Radiation Effects in Advanced Semiconductor Materials and Devices |
| Author(s) | Claeys, C;Simoen, E |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2002. |
| Description | XXII, 404 p : online resource |
| Abstract Note | In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments |
| ISBN,Price | 9783662049747 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. CLASSICAL ELECTRODYNAMICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
7. ELECTRODYNAMICS
8. Electronic materials
9. Energy and state
10. Energy policy
11. Energy Policy, Economics and Management
12. MATERIALS SCIENCE
13. Materials???Surfaces
14. Optical and Electronic Materials
15. OPTICAL MATERIALS
16. OPTICS
17. Surfaces and Interfaces, Thin Films
18. THIN FILMS
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| Item Type | eBook |
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Call# | Status | Issued To | Return Due On | Physical Location |
| I11304 |
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