Title Transmission Electron Microscopy and Diffractometry of Materials Author(s) Fultz, Brent;Howe, James M Publication Berlin, Heidelberg, Springer Berlin Heidelberg, 2001. Description XIX, 748 p : online resource Abstract Note This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD ISBN,Price 9783662045169 Keyword(s) 1. EBOOK 2. EBOOK - SPRINGER 3. Interfaces (Physical sciences) 4. Materials???Surfaces 5. MICROSCOPY 6. SOLID STATE PHYSICS 7. SPECTROSCOPY 8. Spectroscopy and Microscopy 9. Surface and Interface Science, Thin Films 10. Surfaces (Physics) 11. Surfaces and Interfaces, Thin Films 12. THIN FILMS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I11423     On Shelf