Title Si Detectors and Characterization for HEP and Photon Science Experiment : How to Design Detectors by TCAD Simulation Author(s) Srivastava, Ajay Kumar Publication Cham, Springer International Publishing, 2019. Description XVII, 183 p. 106 illus., 77 illus. in color : online resource Abstract Note This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation. Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors. The book is intended for researchers and master???s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. ISBN,Price 9783030195311 Keyword(s) 1. Characterization and Evaluation of Materials 2. Computer-aided engineering 3. Computer-Aided Engineering (CAD, CAE) and Design 4. EBOOK 5. EBOOK - SPRINGER 6. Heavy ions 7. MATERIALS SCIENCE 8. Measurement Science and Instrumentation 9. Measurement?????? 10. NUCLEAR PHYSICS 11. Nuclear Physics, Heavy Ions, Hadrons 12. Particle acceleration 13. Particle Acceleration and Detection, Beam Physics 14. PHYSICAL MEASUREMENTS 15. SOLID STATE PHYSICS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I08677     On Shelf