Title Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials Author(s) Breitenstein, Otwin;Warta, Wilhelm;Schubert, Martin C Publication Cham, Springer International Publishing, 2018. Description XXI, 321 p. 126 illus., 68 illus. in color : online resource Abstract Note This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included ISBN,Price 9783319998251 Keyword(s) 1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. LASERS 5. MATERIALS SCIENCE 6. MICROWAVES 7. Microwaves, RF and Optical Engineering 8. OPTICAL ENGINEERING 9. Optics, Lasers, Photonics, Optical Devices 10. PHOTONICS 11. Structural Materials Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I08882     On Shelf