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| Title | Progress in Nanoscale Characterization and Manipulation |
| Author(s) | Wang, Rongming;Wang, Chen;Zhang, Hongzhou;Tao, Jing;Bai, Xuedong |
| Publication | Singapore, Springer Singapore, 2018. |
| Description | VII, 508 p. 333 illus., 26 illus. in color : online resource |
| Abstract Note | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field |
| ISBN,Price | 9789811304545 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. MATERIALS SCIENCE
5. MICROSCOPY
6. Nanoscale science
7. Nanoscale Science and Technology
8. NANOSCIENCE
9. Nanostructures
10. SPECTROSCOPY
11. Spectroscopy and Microscopy
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| Item Type | eBook |
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Circulation Data
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Call# | Status | Issued To | Return Due On | Physical Location |
| I09044 |
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