Title Metrology and Physical Mechanisms in New Generation Ionic Devices Author(s) Celano, Umberto Publication Cham, Springer International Publishing, 2016. Description XXIV, 175 p. 96 illus., 18 illus. in color : online resource Abstract Note The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. ISBN,Price 9783319395319 Keyword(s) 1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. MICROSCOPY 6. NANOTECHNOLOGY 7. Nanotechnology and Microengineering 8. SPECTROSCOPY 9. Spectroscopy and Microscopy Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I09851     On Shelf