Title Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization Author(s) Sadewasser, Sascha;Glatzel, Thilo Publication Cham, Springer International Publishing, 2018. Description XXIV, 521 p. 234 illus., 194 illus. in color : online resource Abstract Note This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors??? previous volume ???Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,??? presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field ISBN,Price 9783319756875 Keyword(s) 1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Materials???Surfaces 6. Measurement Science and Instrumentation 7. Measurement?????? 8. MICROSCOPY 9. NANOTECHNOLOGY 10. Nanotechnology and Microengineering 11. PHYSICAL MEASUREMENTS 12. SPECTROSCOPY 13. Spectroscopy and Microscopy 14. Surfaces and Interfaces, Thin Films 15. THIN FILMS Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I09919     On Shelf