Title Using Imperfect Semiconductor Systems for Unique Identification Author(s) Roberts, Jonathan Publication Cham, Springer International Publishing, 2017. Description XV, 123 p. 72 illus., 8 illus. in color : online resource Abstract Note This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad ISBN,Price 9783319678917 Keyword(s) 1. EBOOK 2. EBOOK - SPRINGER 3. Electronic materials 4. Optical and Electronic Materials 5. OPTICAL MATERIALS 6. Security Science and Technology 7. SEMICONDUCTORS 8. System safety Item Type eBook Multi-Media Links Please Click here for eBook Circulation Data Accession#   Call# Status Issued To Return Due On Physical Location I10208     On Shelf