TitleResonant X-Ray Scattering in Correlated Systems
Author(s)Murakami, Youichi;Ishihara, Sumio
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 2017.
DescriptionVII, 241 p. 151 illus., 25 illus. in color : online resource
Abstract NoteThe research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown
ISBN,Price9783662532270
Keyword(s)1. Characterization and Evaluation of Materials 2. CONDENSED MATTER 3. CONDENSED MATTER PHYSICS 4. EBOOK 5. EBOOK - SPRINGER 6. MATERIALS SCIENCE 7. MICROSCOPY 8. NANOTECHNOLOGY 9. Nanotechnology and Microengineering 10. SPECTROSCOPY 11. Spectroscopy and Microscopy
Item TypeeBook
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession#  Call#StatusIssued ToReturn Due On Physical Location
I10470     On Shelf