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Title | Atomic and Electronic Properties of 2D Moir?? Interfaces |
Author(s) | Weston, Astrid |
Publication | Cham, 1. Imprint: Springer
2. Springer International Publishing, 2022. |
Description | XIV, 140 p. 91 illus., 86 illus. in color : online resource |
Abstract Note | This thesis provides the first atomic length-scale observation of the structural transformation (referred to as lattice reconstruction) that occurs in moir?? superlattices of twisted bilayer transition metal dichalcogenides (TMDs) at low (?? < 2??) twist angles. Studies using Scanning transmission electron microscopy (STEM) were limited due to the complexity of the (atomically-thin) sample fabrication requirements. This work developed a unique way to selectively cut and re-stack monolayers of TMDs with a controlled rotational twist angle which could then be easily suspended on a TEM grid to meet the needs of the atomically thin sample requirements. The fabrication technique enabled the study of the two common stacking-polytypes including 3R and 2H (using MoS2 and WS2 as the example) as well as their structural evolution with decreasing twist-angle. Also reported is a comprehensive investigation of electronic properties using scanning probe microscopy and electrical transport measurements of the artificially-engineered structures. These and other studies highlight the unique intrinsic properties of TMDs and their potential application in the development of the next generation of optoelectronics |
ISBN,Price | 9783031120930 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Electronics???Materials
5. Materials???Microscopy
6. MICROSCOPY
7. OPTICAL MATERIALS
8. OPTOELECTRONIC DEVICES
9. Surfaces (Technology)
10. Surfaces, Interfaces and Thin Film
11. THIN FILMS
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Item Type | Book |
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Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I12241 |
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