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Click the serial number on the left to view the details of the item. |
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Author | Title | Accn# | Year | Item Type | Claims |
491 |
Kressel, H |
Semiconductor Devices for Optical Communication |
I01574 |
1982 |
eBook |
|
492 |
Trishenkov, M.A |
Detection of Low-Level Optical Signals |
I01531 |
1997 |
eBook |
|
493 |
Thong, John T.L |
Electron Beam Testing Technology |
I01507 |
1993 |
eBook |
|
494 |
Ibach, Harald |
Electron Energy Loss Spectrometers |
I01438 |
1991 |
eBook |
|
495 |
Luy, Johann-Friedrich |
Silicon-Based Millimeter-Wave Devices |
I01427 |
1994 |
eBook |
|
496 |
M??ller-Warmuth, W |
Progress in Intercalation Research |
I01284 |
1994 |
eBook |
|
497 |
Vasko, Fedor T |
Electronic States and Optical Transitions in Semiconductor Heterostructures |
I01077 |
1999 |
eBook |
|
498 |
Heinrich, Helmut |
Physics and Technology of Submicron Structures |
I00998 |
1988 |
eBook |
|
499 |
Hadjipanayis, G.C |
Science and Technology of Nanostructured Magnetic Materials |
I00985 |
1991 |
eBook |
|
500 |
Seeger, Karlheinz |
Semiconductor Physics |
I00893 |
1997 |
eBook |
|
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492.
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Title | Detection of Low-Level Optical Signals : Photodetectors, Focal Plane Arrays and Systems |
Author(s) | Trishenkov, M.A |
Publication | Dordrecht, Springer Netherlands, 1997. |
Description | XXII, 458 p : online resource |
Abstract Note | This book is addressed to designers of photodetectors and photodetecting systems, designers of focal plane arrays, charge-coupled devices, specialists in IR technologies, designers of optoelectronic detecting, guiding and tracking systems, systems for IR direction finders, lidars, lightwave communication systems, IR imagers. All these specialists are united by one common purpose: they are all striving to catch the weakest possible optical signal. The most important characteristic of photosensitive devices is their detectivity, which determines the lowest level of optical signal they are able to detect above the noise level. These threshold characteristics define the most important tactical and technical parameters of the entire optoelectronic system, such as its range, resolution, precision. The threshold characteristics of optoelectronic system depend on many of its components; all designers agree, however, that the critically responsible part of the system is the photodetector [1]. By the end of the 1960s the physicists and the engineers were able to overcome many obstacles and to create photodetectors (at least single-element or few-element ones) which covered all the main optical bands (0. 4 . . . 2,2 . . . 3, 3 . . . 5,8 . . . 14 J. . Lm), carried out the detection almost without any loss (the quantum yield being as high as 0. 7 . . . 0. 9), and reduced the noise level to the lowest possible limit |
ISBN,Price | 9789401512909 |
Keyword(s) | 1. Automotive engineering
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRICAL ENGINEERING
5. Electronic materials
6. Image Processing and Computer Vision
7. LASERS
8. Optical and Electronic Materials
9. OPTICAL DATA PROCESSING
10. OPTICAL MATERIALS
11. Optics, Lasers, Photonics, Optical Devices
12. PHOTONICS
|
Item Type | eBook |
Multi-Media Links
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Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01531 |
|
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On Shelf |
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493.
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Title | Electron Beam Testing Technology |
Author(s) | Thong, John T.L |
Publication | New York, NY, Springer US, 1993. |
Description | XVI, 462 p : online resource |
Abstract Note | Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age |
ISBN,Price | 9781489915221 |
Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
7. ELECTRICAL ENGINEERING
8. Electronic materials
9. MICROSCOPY
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. SOLID STATE PHYSICS
13. SPECTROSCOPY
14. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01507 |
|
|
On Shelf |
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494.
|
|
Title | Electron Energy Loss Spectrometers : The Technology of High Performance |
Author(s) | Ibach, Harald |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1991. |
Description | VIII, 181 p. 2 illus : online resource |
Abstract Note | Electron energy loss spectroscopy has become an indispensable tool in surface analysis. Although the basic physics of this technique is well understood, instrument design has previously largely been left to intuition. This book is the first to provide a comprehensive treatment of the electron optics involved in the production of intense monochromatic beams and the detection of scattered electrons. It includes a full three-dimensional analysis of the electron optical properties of electron emission systems, monochromators and lens systems, placing particular emphasis on the procedures for matching the various components. The description is kept mathematically simple and focuses on practical aspects, with many hints for writing computer codes to calculate and optimize electrostatic lens elements |
ISBN,Price | 9783540471578 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Mathematical Methods in Physics
5. MICROSCOPY
6. Numerical and Computational Physics, Simulation
7. Optical and Electronic Materials
8. OPTICAL MATERIALS
9. PHYSICAL CHEMISTRY
10. PHYSICS
11. SOLID STATE PHYSICS
12. SPECTROSCOPY
13. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01438 |
|
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On Shelf |
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495.
|
|
Title | Silicon-Based Millimeter-Wave Devices |
Author(s) | Luy, Johann-Friedrich;Russer, Peter |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1994. |
Description | XVI, 343 p : online resource |
Abstract Note | Silicon-Based Millimeter-Wave Devices describes field-theoretical methods for the design and analysis of planar waveguide structures and antennas. The principles and limitations of transit-time devices with different injection mechanisms are discussed, as are aspects of fabrication and characterization. The physical properties of silicon Schottky contacts and diodes are treated in a separate chapter. Two chapters cover the silicon/germanium devices: physics and RF properties of the heterobipolar transistor and quantum effect devices such as the resonant tunneling element are described. The integration of devices in monolithic circuits is explained and advanced technologies are presented along with the self-mixing oscillator operation. Finally sensor and system applications are considered |
ISBN,Price | 9783642790317 |
Keyword(s) | 1. Communications Engineering, Networks
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRICAL ENGINEERING
5. Electronic materials
6. ELECTRONICS
7. Electronics and Microelectronics, Instrumentation
8. MICROELECTRONICS
9. Optical and Electronic Materials
10. OPTICAL MATERIALS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01427 |
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On Shelf |
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496.
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Title | Progress in Intercalation Research |
Author(s) | M??ller-Warmuth, W;Sch??llhorn, R |
Publication | Dordrecht, Springer Netherlands, 1994. |
Description | XIV, 514 p : online resource |
Abstract Note | The combination of solid materials of different structural dimensionality with atomic or molecular guest species via intercalation processes represents a unique and widely variable low temperature synthesis strategy for the design of solids with particular composition, structure and physical properties. In the last decade this field has experienced a rapid development and represents now an established specific domain of solid state research and materials science. Substantial progress has been made with respect to an understanding of the complex relationship between structure, bonding, physical properties and chemical reactivity since the first volume on the subject appeared in this series in 1979 (Intercalated Layered Materials, F. Levy, ed.). The purpose of this volume is to present a survey on progress and per?? spectives based on the treatment of a series of major areas of activities in this field. By the very nature of its subject this monograph has an interdisciplinary character and addresses itself to chemists, physicists and materials scien?? tists interested in intercalation research and related aspects such as design and characterization of complex materials, low temperature synthesis, solid state reaction mechanisms, electronic/ionic conductivity, control of electronic properties of solids with different structural dimensionality and application of intercalation systems. Several chapters have been devoted to specific groups of host lattices |
ISBN,Price | 9789401108904 |
Keyword(s) | 1. Analytical chemistry
2. Characterization and Evaluation of Materials
3. EBOOK
4. EBOOK - SPRINGER
5. Electronic materials
6. MATERIALS SCIENCE
7. Optical and Electronic Materials
8. OPTICAL MATERIALS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01284 |
|
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On Shelf |
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497.
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Title | Electronic States and Optical Transitions in Semiconductor Heterostructures |
Author(s) | Vasko, Fedor T;Kuznetsov, Alex V |
Publication | New York, NY, Springer New York, 1999. |
Description | VII, 401 p : online resource |
Abstract Note | The study of semiconductor heterostructures started more than forty years ago. In the 1980s this area of research moved to the forefront of semiconduc?? tor physics, largely due to progress in growth technologies which are now capable of producing ultrathin layers (up to a few monolayers) of different semiconductor materials. The availability of structures with nearly ideal, well-controlled properties has made semiconductor heterostructures a test?? ing ground for solid-state physics. These structures have had a profound impact on basic research in semiconductor physics by opening new possibil?? ities for studying low-dimensional electrons, as well as the atomic and elec?? tronic properties of interfaces. Semiconductor heterostructures have also a variety of important practical applications: they provide a material basis for a number of novel devices, and also open the way for improving the operating characteristics of traditional micro- and optoelectronic compo?? nents. As a result of the growing importance of heterostructure physics, more and more people are entering this dynamic field, either from graduate school or from other areas of research. For the new entrants, the task of familiariz?? ing themselves with the vast body of existing knowledge about heterostruc?? tures has become quite a challenge, due to the rapid development of the field and its increasing subdivision into distinct subfields. Even for those who already work in one area of heterostructure physics, keeping up with the developments in neighboring areas is not an easy task. The purpose of this book is to make heterostructure physics more accessible |
ISBN,Price | 9781461205357 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Optical and Electronic Materials
5. OPTICAL MATERIALS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01077 |
|
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On Shelf |
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498.
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Title | Physics and Technology of Submicron Structures : Proceedings of the Fifth International Winter School, Mauterndorf, Austria, February 22???26, 1988 |
Author(s) | Heinrich, Helmut;Neubauer, G??nther;Kuchar, Friedemar |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1988. |
Description | X, 287 p : online resource |
Abstract Note | This volume presents a discussion of the latest results in the physics of low-dimensional structures. At the winter school major breakthroughs were reported, and some of the excitement of the participants is reflected in the contributions. The topics treated range from the fabrication of microstructures and the physical background of future semiconductor devices to vertical transport in nanostructures, universal conductance fluctuations, and the transition from two-dimensional to one-dimensional conduction in semiconductor structures |
ISBN,Price | 9783642834318 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Optical and Electronic Materials
5. OPTICAL MATERIALS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I00998 |
|
|
On Shelf |
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500.
| |
Title | Semiconductor Physics : An Introduction |
Author(s) | Seeger, Karlheinz |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1997. |
Description | XII, 515 p : online resource |
Abstract Note | Semiconductor Physics - An Introduction - is suitable for the senior undergraduate or new graduate student majoring in electrical engineering or physics. It will also be useful to solid-state scientists and device engineers involved in semiconductor design and technology. The text provides a lucid account of charge transport, energy transport and optical processes, and a detailed description of many devices. It includes sections on superlattices and quantum well structures, the effects of deep-level impurities on transport, the quantum Hall effect and the calculation of the influence of a magnetic field on the carrier distribution function. This 6th edition has been revised and corrected, and new sections have been added to different chapters |
ISBN,Price | 9783662033470 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. ELECTRONICS
5. Electronics and Microelectronics, Instrumentation
6. Materials???Surfaces
7. MICROELECTRONICS
8. Optical and Electronic Materials
9. OPTICAL MATERIALS
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I00893 |
|
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On Shelf |
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