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Author | Title | Accn# | Year | Item Type | Claims |
| 1 |
Daillant, Jean |
X-ray and Neutron Reflectivity |
I07441 |
2009 |
eBook |
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| 2 |
Daillant, Jean |
X-Ray and Neutron Reflectivity: Principles and Applications |
I00097 |
1999 |
eBook |
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1.
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| Title | X-ray and Neutron Reflectivity : Principles and Applications |
| Author(s) | Daillant, Jean;Gibaud, Alain |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2009. |
| Description | XIV, 350 p : online resource |
| Abstract Note | This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures. For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been throughly revised, updated and, where appropriate, suitably augmented. The first edition was been published as Lect. Notes Phys. m58 in the same series |
| ISBN,Price | 9783540885887 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. MATERIALS SCIENCE
5. Materials???Surfaces
6. MICROSCOPY
7. SOLID STATE PHYSICS
8. SPECTROSCOPY
9. Spectroscopy and Microscopy
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
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| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I07441 |
|
|
On Shelf |
|
|
|
|
2.
 | |
| Title | X-Ray and Neutron Reflectivity: Principles and Applications |
| Author(s) | Daillant, Jean;Gibaud, Alain |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1999. |
| Description | XXIII, 331 p : online resource |
| Abstract Note | The book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students |
| ISBN,Price | 9783540486961 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Materials???Surfaces
4. MICROSCOPY
5. Particle acceleration
6. Particle Acceleration and Detection, Beam Physics
7. SOLID STATE PHYSICS
8. SPECTROSCOPY
9. Spectroscopy and Microscopy
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I00097 |
|
|
On Shelf |
|
|
|
| |