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 #  AuthorTitleAccn#YearItem Type Claims
1 Reimer, Ludwig Transmission Electron Microscopy I05981 2008 eBook  
2 Reimer, Ludwig Scanning Electron Microscopy I04321 1998 eBook  
3 Reimer, Ludwig Scanning Electron Microscopy I02910 1985 eBook  
4 Reimer, Ludwig Transmission Electron Microscopy I02760 1993 eBook  
5 Reimer, Ludwig Transmission Electron Microscopy I02590 1989 eBook  
6 Reimer, Ludwig Transmission Electron Microscopy I02401 1997 eBook  
7 Reimer, Ludwig Transmission Electron Microscopy I02327 1984 eBook  
8 Reimer, Ludwig Energy-Filtering Transmission Electron Microscopy I00254 1995 eBook  
(page:1 / 1) [#8]     

1.    
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TitleTransmission Electron Microscopy : Physics of Image Formation
Author(s)Reimer, Ludwig;Kohl, Helmut
PublicationNew York, NY, Springer New York, 2008.
DescriptionXVI, 590 p. 276 illus : online resource
Abstract NoteTransmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text
ISBN,Price9780387347585
Keyword(s)1. CELL BIOLOGY 2. CONDENSED MATTER 3. CONDENSED MATTER PHYSICS 4. EBOOK 5. EBOOK - SPRINGER 6. LASERS 7. Optics, Lasers, Photonics, Optical Devices 8. PHOTONICS 9. Science, Humanities and Social Sciences, multidisciplinary
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2.     
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TitleScanning Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1998.
DescriptionXIV, 529 p : online resource
Abstract NoteScanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information
ISBN,Price9783540389675
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. Interfaces (Physical sciences) 4. MICROSCOPY 5. PHYSICS 6. Physics, general 7. SOLID STATE PHYSICS 8. SPECTROSCOPY 9. Spectroscopy and Microscopy 10. Surface and Interface Science, Thin Films 11. Surfaces (Physics) 12. THIN FILMS
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3.     
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TitleScanning Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1985.
DescriptionXVIII, 463 p. 243 illus : online resource
Abstract NoteThe aim of this book is to outline the physics of image formation, electron?? specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of M??nster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron?? specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec?? tron beam can be blanked at high frequencies for time-resolving exper?? iments and what problems have tobe taken into account when focusing
ISBN,Price9783662135624
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. MICROSCOPY 4. SOLID STATE PHYSICS 5. SPECTROSCOPY 6. Spectroscopy and Microscopy
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I02910     On Shelf    

4.     
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TitleTransmission Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1993.
DescriptionXIV, 545 p : online resource
Abstract Note"Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature
ISBN,Price9783662215562
Keyword(s)1. CELL BIOLOGY 2. EBOOK 3. EBOOK - SPRINGER 4. ENGINEERING 5. Engineering, general 6. MICROSCOPY 7. Pathology 8. PHYSICAL CHEMISTRY 9. SOLID STATE PHYSICS 10. SPECTROSCOPY 11. Spectroscopy and Microscopy
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I02760     On Shelf    

5.     
No image available
TitleTransmission Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1989.
DescriptionXIII, 547 p. 127 illus : online resource
Abstract NoteThe aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy
ISBN,Price9783662215791
Keyword(s)1. Biological and Medical Physics, Biophysics 2. BIOLOGICAL PHYSICS 3. BIOPHYSICS 4. EBOOK 5. EBOOK - SPRINGER 6. MICROSCOPY 7. SOLID STATE PHYSICS 8. SPECTROSCOPY 9. Spectroscopy and Microscopy
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I02590     On Shelf    

6.     
No image available
TitleTransmission Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1997.
DescriptionXVI, 587 p. 185 illus : online resource
Abstract NoteTransmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices
ISBN,Price9783662148242
Keyword(s)1. CELL BIOLOGY 2. EBOOK 3. EBOOK - SPRINGER 4. Measurement Science and Instrumentation 5. Measurement?????? 6. PHYSICAL MEASUREMENTS
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7.     
No image available
TitleTransmission Electron Microscopy : Physics of Image Formation and Microanalysis
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1984.
DescriptionXII, 521 p. 59 illus : online resource
Abstract NoteThe aim of this book is to outline the physics of image formation, electron?? specimen interactions and image interpretation in transmission electron mic?? roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek?? tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec?? trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni?? tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast
ISBN,Price9783662135532
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. MICROSCOPY 4. MINERALOGY 5. SPECTROSCOPY 6. Spectroscopy and Microscopy
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I02327     On Shelf    

8.    
No image available
TitleEnergy-Filtering Transmission Electron Microscopy
Author(s)Reimer, Ludwig
PublicationBerlin, Heidelberg, Springer Berlin Heidelberg, 1995.
DescriptionXIII, 425 p. 157 illus : online resource
Abstract NoteEnergy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument
ISBN,Price9783540489955
Keyword(s)1. Biological and Medical Physics, Biophysics 2. BIOLOGICAL PHYSICS 3. BIOPHYSICS 4. COMPLEXITY 5. COMPUTATIONAL COMPLEXITY 6. EBOOK 7. EBOOK - SPRINGER 8. MICROSCOPY 9. MINERALOGY 10. SOLID STATE PHYSICS 11. SPECTROSCOPY 12. Spectroscopy and Microscopy
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