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Click the serial number on the left to view the details of the item. |
| # |
Author | Title | Accn# | Year | Item Type | Claims |
| 1 |
Pietsch, Ullrich |
High-Resolution X-Ray Scattering |
I10804 |
2004 |
eBook |
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| 2 |
Holy, Vaclav |
High-Resolution X-Ray Scattering from Thin Films and Multilayers |
I00930 |
1999 |
eBook |
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1.
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| Title | High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures |
| Author(s) | Pietsch, Ullrich;Holy, Vaclav;Baumbach, Tilo |
| Publication | New York, NY, Springer New York, 2004. |
| Description | XVI, 408 p. 389 illus : online resource |
| Abstract Note | During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap?? pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers |
| ISBN,Price | 9781475740509 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. LASERS
5. Materials???Surfaces
6. NANOTECHNOLOGY
7. Optical and Electronic Materials
8. OPTICAL MATERIALS
9. Optics, Lasers, Photonics, Optical Devices
10. PHOTONICS
11. Surfaces and Interfaces, Thin Films
12. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I10804 |
|
|
On Shelf |
|
|
|
|
2.
 | |
| Title | High-Resolution X-Ray Scattering from Thin Films and Multilayers |
| Author(s) | Holy, Vaclav;Pietsch, Ullrich;Baumbach, Tilo |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1999. |
| Description | XI, 258 p. 140 illus : online resource |
| Abstract Note | This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis |
| ISBN,Price | 9783540496250 |
| Keyword(s) | 1. CRYSTALLOGRAPHY
2. Crystallography and Scattering Methods
3. EBOOK
4. EBOOK - SPRINGER
5. LASERS
6. Materials???Surfaces
7. Optics, Lasers, Photonics, Optical Devices
8. PHOTONICS
9. Surfaces and Interfaces, Thin Films
10. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I00930 |
|
|
On Shelf |
|
|
|
| |