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Author | Title | Accn# | Year | Item Type | Claims |
| 1 |
Poulsen, Henning Friis |
Three-Dimensional X-Ray Diffraction Microscopy |
I11084 |
2004 |
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| Title | Three-Dimensional X-Ray Diffraction Microscopy : Mapping Polycrystals and their Dynamics |
| Author(s) | Poulsen, Henning Friis |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2004. |
| Description | XII, 156 p : online resource |
| Abstract Note | Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science |
| ISBN,Price | 9783540444831 |
| Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
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| Item Type | eBook |
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Call# | Status | Issued To | Return Due On | Physical Location |
| I11084 |
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