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Click the serial number on the left to view the details of the item. |
| # |
Author | Title | Accn# | Year | Item Type | Claims |
| 1 |
Gnecco, Enrico |
Fundamentals of Friction and Wear on the Nanoscale |
I13136 |
2024 |
eBook |
|
| 2 |
Meyer, Ernst |
Scanning Probe Microscopy |
I11811 |
2021 |
eBook |
|
| 3 |
Meyer, Ernst |
Scanning Probe Microscopy |
I11583 |
2004 |
eBook |
|
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|
1.
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| Title | Fundamentals of Friction and Wear on the Nanoscale |
| Author(s) | Gnecco, Enrico;Meyer, Ernst |
| Publication | Cham, 1. Imprint: Springer
2. Springer International Publishing, 2024. |
| Description | XIX, 452 p. 208 illus., 155 illus. in color : online resource |
| Abstract Note | This book offers a comprehensive review on the latest developments in the field of nanotribology. With contributed chapters covering instrumental aspects, theoretical models, and selected experimental results, this book provides a broad overview of the fundamental issues currently being investigated in the field. The updated third edition includes new topics such as molecular tribology, multiscale structural lubricity, tribofilm growth, nanoscale friction in liquids, and nanotribology at insect-plant interfaces. Written by a highly qualified group of international experts, this book aims to be a key reference on the subject for the next five to ten years, highlighting the importance of understanding the atomistic origins of friction and wear in everyday life and in technical applications |
| ISBN,Price | 9783031630651 |
| Keyword(s) | 1. Computational Materials Science
2. CONDENSED MATTER
3. EBOOK
4. EBOOK - SPRINGER
5. MATERIALS
6. MATERIALS SCIENCE
7. MICROSCOPY
8. Nanophysics
9. NANOSCIENCE
10. Surfaces (Technology)
11. Surfaces, Interfaces and Thin Film
12. THIN FILMS
13. TRIBOLOGY
14. Two-dimensional Materials
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I13136 |
|
|
On Shelf |
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2.
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| Title | Scanning Probe Microscopy : The Lab on a Tip |
| Author(s) | Meyer, Ernst;Bennewitz, Roland;Hug, Hans J |
| Publication | Cham, Springer International Publishing, 2021. |
| Description | XIV, 322 p. 194 illus., 89 illus. in color : online resource |
| Abstract Note | Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques |
| ISBN,Price | 9783030370893 |
| Keyword(s) | 1. Characterization and Analytical Technique
2. CONDENSED MATTER
3. CONDENSED MATTER PHYSICS
4. EBOOK
5. EBOOK - SPRINGER
6. Materials???Analysis
7. MEASUREMENT
8. Measurement Science and Instrumentation
9. MEASURING INSTRUMENTS
10. SPECTROSCOPY
11. SPECTRUM ANALYSIS
12. Surfaces (Technology)
13. Surfaces, Interfaces and Thin Film
14. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I11811 |
|
|
On Shelf |
|
|
|
|
|
3.
| |
| Title | Scanning Probe Microscopy : The Lab on a Tip |
| Author(s) | Meyer, Ernst;Hug, Hans Josef;Bennewitz, Roland |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2004. |
| Description | X, 210 p. 204 illus., 15 illus. in color : online resource |
| Abstract Note | Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques |
| ISBN,Price | 9783662098011 |
| Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. EBOOK
4. EBOOK - SPRINGER
5. Materials???Surfaces
6. Measurement Science and Instrumentation
7. Measurement??????
8. MICROSCOPY
9. NANOTECHNOLOGY
10. PHYSICAL MEASUREMENTS
11. SOLID STATE PHYSICS
12. SPECTROSCOPY
13. Spectroscopy and Microscopy
14. Surfaces and Interfaces, Thin Films
15. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I11583 |
|
|
On Shelf |
|
|
|
| |