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| # |
Author | Title | Accn# | Year | Item Type | Claims |
| 1 |
Fujiwara, Hiroyuki |
Spectroscopic Ellipsometry for Photovoltaics |
I09561 |
2018 |
eBook |
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| 2 |
Fujiwara, Hiroyuki |
Spectroscopic Ellipsometry for Photovoltaics |
I08764 |
2018 |
eBook |
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| Title | Spectroscopic Ellipsometry for Photovoltaics : Volume 1: Fundamental Principles and Solar Cell Characterization |
| Author(s) | Fujiwara, Hiroyuki;Collins, Robert W |
| Publication | Cham, Springer International Publishing, 2018. |
| Description | XX, 594 p. 336 illus., 266 illus. in color : online resource |
| Abstract Note | This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers |
| ISBN,Price | 9783319753775 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. LASERS
5. MICROWAVES
6. Microwaves, RF and Optical Engineering
7. Optical and Electronic Materials
8. OPTICAL ENGINEERING
9. OPTICAL MATERIALS
10. Optics, Lasers, Photonics, Optical Devices
11. PHOTONICS
12. Renewable and Green Energy
13. Renewable energy resources
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09561 |
|
|
On Shelf |
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|
2.
 | |
| Title | Spectroscopic Ellipsometry for Photovoltaics : Volume 2: Applications and Optical Data of Solar Cell Materials |
| Author(s) | Fujiwara, Hiroyuki;Collins, Robert W |
| Publication | Cham, Springer International Publishing, 2018. |
| Description | XXI, 616 p. 330 illus., 204 illus. in color : online resource |
| Abstract Note | Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses |
| ISBN,Price | 9783319951386 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. LASERS
5. MICROSCOPY
6. MICROWAVES
7. Microwaves, RF and Optical Engineering
8. Optical and Electronic Materials
9. OPTICAL ENGINEERING
10. OPTICAL MATERIALS
11. Optics, Lasers, Photonics, Optical Devices
12. PHOTONICS
13. Renewable and Green Energy
14. Renewable energy resources
15. SPECTROSCOPY
16. Spectroscopy and Microscopy
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I08764 |
|
|
On Shelf |
|
|
|
| |