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1 T.P. Ma (ed.) Ionizing radiation effects in MOS devices and circuits 001636 1989 Book  
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TitleIonizing radiation effects in MOS devices and circuits
Author(s)T.P. Ma (ed.);Paul V. Dressendorfer (ed.)
PublicationNew York, John Wiley and Sons, 1989.
Descriptionxviii,587p.
Classification621.3.049.774.2
Keyword(s)METAL OXIDE SEMICONDUCTORS EFF
Item TypeBook

Circulation Data
Accession#  Call#StatusIssued ToReturn Due On Physical Location
001636   621.3.049.774.2/MA/001636  On Shelf    

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