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Author | Title | Accn# | Year | Item Type | Claims |
| 21 |
Li, Zhiqiang |
The Source/Drain Engineering of Nanoscale Germanium-based MOS Devices |
I10059 |
2016 |
eBook |
|
| 22 |
Park, Byung-Eun |
Ferroelectric-Gate Field Effect Transistor Memories |
I10043 |
2016 |
eBook |
|
| 23 |
Micheloni, Rino |
Inside Solid State Drives (SSDs) |
I10029 |
2018 |
eBook |
|
| 24 |
Zhu, Min |
Ti-Sb-Te Phase Change Materials: Component Optimisation, Mechanism and Applications |
I09964 |
2017 |
eBook |
|
| 25 |
Iftikhar, Zubair |
Charge Quantization and Kondo Quantum Criticality in Few-Channel Mesoscopic Circuits |
I09929 |
2018 |
eBook |
|
| 26 |
Wriedt, Thomas |
The Generalized Multipole Technique for Light Scattering |
I09917 |
2018 |
eBook |
|
| 27 |
Frater, R.H |
Four Pillars of Radio Astronomy: Mills, Christiansen, Wild, Bracewell |
I09893 |
2017 |
eBook |
|
| 28 |
Punter-Villagrasa, Jaime |
Amperometric and Impedance Monitoring Systems for Biomedical Applications |
I09848 |
2017 |
eBook |
|
| 29 |
Parinov, Ivan A |
Advanced Materials |
I09832 |
2017 |
eBook |
|
| 30 |
Huang, Songling |
New Technologies in Electromagnetic Non-destructive Testing |
I09771 |
2016 |
eBook |
|
|
|
21.
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| Title | The Source/Drain Engineering of Nanoscale Germanium-based MOS Devices |
| Author(s) | Li, Zhiqiang |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 2016. |
| Description | XIV, 59 p. 52 illus., 49 illus. in color : online resource |
| Abstract Note | This book mainly focuses on reducing the high parasitic resistance in the source/drain of germanium nMOSFET. With adopting of the Implantation After Germanide (IAG) technique, P and Sb co-implantation technique and Multiple Implantation and Multiple Annealing (MIMA) technique, the electron Schottky barrier height of NiGe/Ge contact is modulated to 0.1eV, the thermal stability of NiGe is improved to 600??? and the contact resistivity of metal/n-Ge contact is drastically reduced to 3.8??10???7?????cm2, respectively. Besides, a reduced source/drain parasitic resistance is demonstrated in the fabricated Ge nMOSFET. Readers will find useful information about the source/drain engineering technique for high-performance CMOS devices at future technology node |
| ISBN,Price | 9783662496831 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. ELECTRONIC CIRCUITS
4. Electronic Circuits and Devices
5. Nanoscale science
6. Nanoscale Science and Technology
7. NANOSCIENCE
8. Nanostructures
9. SEMICONDUCTORS
10. SOLID STATE PHYSICS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I10059 |
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On Shelf |
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22.
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| Title | Ferroelectric-Gate Field Effect Transistor Memories : Device Physics and Applications |
| Author(s) | Park, Byung-Eun;Ishiwara, Hiroshi;Okuyama, Masanori;Sakai, Shigeki;Yoon, Sung-Min |
| Publication | Dordrecht, Springer Netherlands, 2016. |
| Description | XVIII, 347 p. 254 illus., 150 illus. in color : online resource |
| Abstract Note | This book provides comprehensive coverage of the materials characteristics, process technologies, and device operations for memory field-effect transistors employing inorganic or organic ferroelectric thin films. This transistor-type ferroelectric memory has interesting fundamental device physics and potentially large industrial impact. Among the various applications of ferroelectric thin films, the development of nonvolatile ferroelectric random access memory (FeRAM) has progressed most actively since the late 1980s and has achieved modest mass production levels for specific applications since 1995. There are two types of memory cells in ferroelectric nonvolatile memories. One is the capacitor-type FeRAM and the other is the field-effect transistor (FET)-type FeRAM. Although the FET-type FeRAM claims ultimate scalability and nondestructive readout characteristics, the capacitor-type FeRAMs have been the main interest for the major semiconductor memory companies, because the ferroelectric FET has fatal handicaps of cross-talk for random accessibility and short retention time. This book aims to provide readers with the development history, technical issues, fabrication methodologies, and promising applications of FET-type ferroelectric memory devices, presenting a comprehensive review of past, present, and future technologies. The topics discussed will lead to further advances in large-area electronics implemented on glass or plastic substrates as well as in conventional Si electronics. The book is composed of chapters written by leading researchers in ferroelectric materials and related device technologies, including oxide and organic ferroelectric thin films |
| ISBN,Price | 9789402408416 |
| Keyword(s) | 1. CIRCUITS AND SYSTEMS
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRONIC CIRCUITS
5. Electronic Circuits and Devices
6. ELECTRONICS
7. Electronics and Microelectronics, Instrumentation
8. Interfaces (Physical sciences)
9. Materials???Surfaces
10. MICROELECTRONICS
11. Surface and Interface Science, Thin Films
12. Surfaces (Physics)
13. Surfaces and Interfaces, Thin Films
14. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I10043 |
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On Shelf |
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23.
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| Title | Inside Solid State Drives (SSDs) |
| Author(s) | Micheloni, Rino;Marelli, Alessia;Eshghi, Kam |
| Publication | Singapore, Springer Singapore, 2018. |
| Description | XXI, 485 p. 313 illus., 109 illus. in color : online resource |
| Abstract Note | The revised second edition of this respected text provides a state-of-the-art overview of the main topics relating to solid state drives (SSDs), covering NAND flash memories, memory controllers (including booth hardware and software), I/O interfaces (PCIe/SAS/SATA), reliability, error correction codes (BCH and LDPC), encryption, flash signal processing and hybrid storage. Updated throughout to include all recent work in the field, significant changes for the new edition include: A new chapter on flash memory errors and data recovery procedures in SSDs for reliability and lifetime improvement Updated coverage of SSD Architecture and PCI Express Interfaces moving from PCIe Gen3 to PCIe Gen4 and including a section on NVMe over fabric (NVMf) An additional section on 3D flash memories An update on standard reliability procedures for SSDs Expanded coverage of BCH for SSDs, with a specific section on detection A new section on non-binary Low-Density Parity-Check (LDPC) codes, the most recent advancement in the field A description of randomization in the protection of SSD data against attacks, particularly relevant to 3D architectures The SSD market is booming, with many industries placing a huge effort in this space, spending billions of dollars in R&D and product development. Moreover, flash manufacturers are now moving to 3D architectures, thus enabling an even higher level of storage capacity. This book takes the reader through the fundamentals and brings them up to speed with the most recent developments in the field, and is suitable for advanced students, researchers and engineers alike. |
| ISBN,Price | 9789811305993 |
| Keyword(s) | 1. CIRCUITS AND SYSTEMS
2. COMPUTER HARDWARE
3. EBOOK
4. EBOOK - SPRINGER
5. ELECTRONIC CIRCUITS
6. SOLID STATE PHYSICS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I10029 |
|
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On Shelf |
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24.
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| Title | Ti-Sb-Te Phase Change Materials: Component Optimisation, Mechanism and Applications |
| Author(s) | Zhu, Min |
| Publication | Singapore, Springer Singapore, 2017. |
| Description | XVI, 124 p. 83 illus : online resource |
| Abstract Note | This book introduces a novel Ti-Sb-Te alloy for high-speed and low-power phase-change memory applications, which demonstrates a phase-change mechanism that differs significantly from that of conventional Ge2Sb2Te5 and yields favorable overall performance. Systematic methods, combined with better material characteristics, are used to optimize the material components and device performance. Subsequently, a phase-change memory chip based on the optimized component is successfully fabricated using 40-nm complementary metal-oxide semiconductor technology, which offers a number of advantages in many embedded applications |
| ISBN,Price | 9789811043826 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. ELECTRONIC CIRCUITS
4. Electronic Circuits and Devices
5. ELECTRONICS
6. Electronics and Microelectronics, Instrumentation
7. MICROELECTRONICS
8. Phase transitions (Statistical physics)
9. Phase Transitions and Multiphase Systems
10. SEMICONDUCTORS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09964 |
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On Shelf |
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25.
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| Title | Charge Quantization and Kondo Quantum Criticality in Few-Channel Mesoscopic Circuits |
| Author(s) | Iftikhar, Zubair |
| Publication | Cham, Springer International Publishing, 2018. |
| Description | XIII, 137 p. 73 illus., 47 illus. in color : online resource |
| Abstract Note | This thesis explores several fundamental topics in mesoscopic circuitries that incorporate few electronic conduction channels. The reported results establish a new state of the art in a field that has been waiting for this kind of experiments for decades. The first experiments address the quantized character of charge in circuits. The thesis discusses the charge quantization criterion, observes the predicted charge quantization scaling, and demonstrates a crossover toward a universal behavior as temperature is increased. In turn, the second set of experiments explores the unconventional quantum critical physics that arises in the multichannel Kondo model. At the symmetric quantum critical point, the predicted universal Kondo fixed points and scaling exponents are observed, and the full numerical renormalization group scaling curves validated. In addition, the thesis explores the crossover from quantum criticality: direct visualization of the development of a quantum phase transition, the parameter space for quantum criticality, as well as universality and scaling behaviors |
| ISBN,Price | 9783319946856 |
| Keyword(s) | 1. Condensed materials
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRONIC CIRCUITS
5. Electronic Circuits and Devices
6. LOW TEMPERATURE PHYSICS
7. LOW TEMPERATURES
8. Phase transformations (Statistical physics)
9. Quantum Gases and Condensates
10. QUANTUM PHYSICS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09929 |
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On Shelf |
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26.
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| Title | The Generalized Multipole Technique for Light Scattering : Recent Developments |
| Author(s) | Wriedt, Thomas;Eremin, Yuri |
| Publication | Cham, Springer International Publishing, 2018. |
| Description | XVI, 249 p. 103 illus., 41 illus. in color : online resource |
| Abstract Note | This book presents the Generalized Multipole Technique as a fast and powerful theoretical and computation tool to simulate light scattering by nonspherical particles. It also demonstrates the considerable potential of the method. In recent years, the concept has been applied in new fields, such as simulation of electron energy loss spectroscopy and has been used to extend other methods, like the null-field method, making it more widely applicable. The authors discuss particular implementations of the GMT methods, such as the Discrete Sources Method (DSM), Multiple Multipole Program (MMP), the Method of Auxiliary Sources (MAS), the Filamentary Current Method (FCM), the Method of Fictitious Sources (MFS) and the Null-Field Method with Discrete Sources (NFM-DS). The Generalized Multipole Technique is a surface-based method to find the solution of a boundary-value problem for a given differential equation by expanding the fields in terms of fundamental or other singular solutions of this equation. The amplitudes of these fundamental solutions are determined from the boundary condition at the particle surface. Electromagnetic and light scattering by particles or systems of particles has been the subject of intense research in various scientific and engineering fields, including astronomy, optics, meteorology, remote sensing, optical particle sizing and electromagnetics, which has led to the development of a large number of modelling methods based on the Generalized Multipole Technique for quantitative evaluation of electromagnetic scattering by particles of various shapes and compositions. The book describes these methods in detail |
| ISBN,Price | 9783319748900 |
| Keyword(s) | 1. Atomic structure????
2. Atomic/Molecular Structure and Spectra
3. CLASSICAL ELECTRODYNAMICS
4. EBOOK
5. EBOOK - SPRINGER
6. ELECTRODYNAMICS
7. ELECTRONIC CIRCUITS
8. Electronic Circuits and Devices
9. Molecular structure??
10. NUCLEAR PHYSICS
11. Numerical and Computational Physics, Simulation
12. OPTICS
13. Particle and Nuclear Physics
14. PHYSICS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09917 |
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On Shelf |
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27.
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| Title | Four Pillars of Radio Astronomy: Mills, Christiansen, Wild, Bracewell |
| Author(s) | Frater, R.H;Goss, W.M;Wendt, H.W |
| Publication | Cham, Springer International Publishing, 2017. |
| Description | XVII, 199 p. 145 illus., 36 illus. in color : online resource |
| Abstract Note | This is the story of Bernie Mills, Chris Christiansen, Paul Wild and Ron Bracewell, members of a team of radio astronomers that would lead Australia, and the world, into this new field of research. Each of the four is remembered for his remarkable work: Mills for the development the cross type instrument that now bears his name; Christiansen for the application of rotational synthesis techniques; Wild for the masterful joining of observations and theory to elicit the nature of the solar atmosphere; Bracewell for his contribution to imaging theory. As well, these Four Pillars are remembered for creating a remarkable environment for scientific discovery and for influencing the careers of future generations. Their pursuit of basic science helped pave the way for technological developments in areas ranging from Wi-Fi to sonar to medical imaging to air navigation, and for underpinning the foundations of modern cosmology and astrophysics |
| ISBN,Price | 9783319655994 |
| Keyword(s) | 1. ASTRONOMY
2. Astronomy, Observations and Techniques
3. Astronomy???Observations
4. EBOOK
5. EBOOK - SPRINGER
6. ELECTRONIC CIRCUITS
7. Electronic Circuits and Devices
8. HISTORY
9. HISTORY OF SCIENCE
10. MICROWAVES
11. Microwaves, RF and Optical Engineering
12. Observations, Astronomical
13. OPTICAL ENGINEERING
14. Popular Science in Astronomy
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09893 |
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On Shelf |
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28.
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| Title | Amperometric and Impedance Monitoring Systems for Biomedical Applications |
| Author(s) | Punter-Villagrasa, Jaime;Colomer-Farrarons, Jordi;del Campo, Francisco J;Miribel, Pere |
| Publication | Cham, Springer International Publishing, 2017. |
| Description | VIII, 241 p. 145 illus., 75 illus. in color : online resource |
| Abstract Note | The book presents the conception and realization of a pervasive electronic architecture for electrochemical applications, focusing on electronic instrumentation design and device development, particularly in electrochemical Point-of-Care and Lab-on-a-Chip devices, covering examples based on amperometric (DC) and impedance detection (AC) techniques. The presented electronics combine tailored front-end instrumentation and back-end data post-processing, enabling applications in different areas, and across a variety of techniques, analytes, transducers and environments. It addresses how the electronics are designed and implemented with special interest in the flow process: starting from electronic circuits and electrochemical biosensor design to a final validation and implementation for specific applications. Similarly, other important aspects are discussed throughout the book, such as electrochemical techniques, different analytes, targets, electronics reliability and robustness. The book also describes the use of the presented electronics in different electrochemical applications through some examples: instantaneous and non-destructive cellular monitoring and portable glucose monitoring device. Moreover, the book aims to introduce a comprehensive approach to electronic circuits, techniques and electrochemical sensors in POC devices to a general audience of students in biomedical and electronics engineering, scientists, and engineers |
| ISBN,Price | 9783319648019 |
| Keyword(s) | 1. Biomedical engineering
2. Biomedical Engineering/Biotechnology
3. CIRCUITS AND SYSTEMS
4. EBOOK
5. EBOOK - SPRINGER
6. Electrochemistry
7. ELECTRONIC CIRCUITS
8. Measurement Science and Instrumentation
9. Measurement??????
10. Medical and Radiation Physics
11. Medical physics
12. PHYSICAL MEASUREMENTS
13. RADIATION
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09848 |
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On Shelf |
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29.
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| Title | Advanced Materials : Techniques, Physics, Mechanics and Applications |
| Author(s) | Parinov, Ivan A;Chang, Shun-Hsyung;Jani, Muaffaq A |
| Publication | Cham, Springer International Publishing, 2017. |
| Description | XXV, 627 p. 374 illus., 188 illus. in color : online resource |
| Abstract Note | This book presents 50 selected peer-reviewed reports from the 2016 International Conference on ???Physics and Mechanics of New Materials and Their Applications???, PHENMA 2016 (Surabaya, Indonesia, 19???22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric crystals, materials and composites, as well as other promising materials with special properties. They present nanotechnology approaches, modern environmentally friendly piezoelectric and ferromagnetic techniques, and physical and mechanical studies of the structural and physical-mechanical properties of the materials discussed.?? Further, a broad range of original mathematical and numerical methods is applied to solve various technological, mechanical and physical problems, which are inte resting for applications. Great attention is devoted to novel devices with high accuracy, longevity and extended possibilities to work in wide temperature and pressure ranges, aggressive media, etc., which show improved characteristics, defined by the developed materials and composites, opening new possibilities to study different physico-mechanical processes and phenomena |
| ISBN,Price | 9783319560625 |
| Keyword(s) | 1. CIRCUITS AND SYSTEMS
2. EBOOK
3. EBOOK - SPRINGER
4. Electrochemistry
5. ELECTRONIC CIRCUITS
6. Electronic Circuits and Devices
7. MECHANICS
8. Mechanics, Applied
9. SEMICONDUCTORS
10. Solid Mechanics
11. Structural Materials
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09832 |
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On Shelf |
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30.
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| Title | New Technologies in Electromagnetic Non-destructive Testing |
| Author(s) | Huang, Songling;Wang, Shen |
| Publication | Singapore, Springer Singapore, 2016. |
| Description | X, 222 p. 193 illus., 146 illus. in color : online resource |
| Abstract Note | This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applications of the electromagnetic NDT technology. It could serve as a valuable reference for college students and relevant NDT technicians. It is also a useful material for qualification training and higher learning for nondestructive testing professionals |
| ISBN,Price | 9789811005787 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRONIC CIRCUITS
5. Electronic Circuits and Devices
6. MAGNETIC MATERIALS
7. MAGNETISM
8. Magnetism, Magnetic Materials
9. MATERIALS SCIENCE
10. Measurement Science and Instrumentation
11. Measurement??????
12. MECHANICS
13. Mechanics, Applied
14. PHYSICAL MEASUREMENTS
15. Solid Mechanics
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09771 |
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On Shelf |
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