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Author | Title | Accn# | Year | Item Type | Claims |
| 291 |
O'Connor, D.J |
Surface Analysis Methods in Materials Science |
I02499 |
1992 |
eBook |
|
| 292 |
Wiesendanger, Roland |
Scanning Tunneling Microscopy III |
I02427 |
1996 |
eBook |
|
| 293 |
Wiesendanger, Roland |
Scanning Tunneling Microscopy III |
I02338 |
1993 |
eBook |
|
| 294 |
Kuzmany, Hans |
Electronic Properties of Polymers |
I02331 |
1992 |
eBook |
|
| 295 |
LeLay, Guy |
Semiconductor Interfaces: Formation and Properties |
I02293 |
1987 |
eBook |
|
| 296 |
Schein, Lawrence B |
Electrophotography and Development Physics |
I02208 |
1992 |
eBook |
|
| 297 |
Daoud, Mohamed |
Soft Matter Physics |
I02181 |
1999 |
eBook |
|
| 298 |
Schlapbach, Louis |
Hydrogen in Intermetallic Compounds II |
I02177 |
1992 |
eBook |
|
| 299 |
MacDonald, R.J |
Surface Science |
I02168 |
1996 |
eBook |
|
| 300 |
Riedling, Karl |
Ellipsometry for Industrial Applications |
I02086 |
1988 |
eBook |
|
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|
291.
  |
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| Title | Surface Analysis Methods in Materials Science |
| Author(s) | O'Connor, D.J;Sexton, Brett A;Smart, Roger St.C |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1992. |
| Description | XXI, 453 p : online resource |
| Abstract Note | The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica?? tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur?? face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter?? ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University |
| ISBN,Price | 9783662027677 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Interfaces (Physical sciences)
4. Materials???Surfaces
5. Surface and Interface Science, Thin Films
6. Surfaces (Physics)
7. Surfaces and Interfaces, Thin Films
8. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02499 |
|
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On Shelf |
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292.
 |
|
| Title | Scanning Tunneling Microscopy III : Theory of STM and Related Scanning Probe Methods |
| Author(s) | Wiesendanger, Roland;G??ntherodt, Hans-Joachim |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1996. |
| Description | XV, 402 p. 26 illus., 3 illus. in color : online resource |
| Abstract Note | Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the filed of local probe methods. In this second edition the text has been updated and new methods are discussed |
| ISBN,Price | 9783642801181 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. ENGINEERING
4. Engineering, general
5. Materials???Surfaces
6. MICROSCOPY
7. SOLID STATE PHYSICS
8. SPECTROSCOPY
9. Spectroscopy and Microscopy
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02427 |
|
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On Shelf |
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293.
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| Title | Scanning Tunneling Microscopy III : Theory of STM and Related Scanning Probe Methods |
| Author(s) | Wiesendanger, Roland;G??ntherodt, Hans-Joachim |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1993. |
| Description | XV, 375 p : online resource |
| Abstract Note | While the first two volumes on Scanning Tunneling Microscopy (STM) and its related scanning probe (SXM) methods have mainly concentrated on intro?? ducing the experimental techniques, as well as their various applications in different research fields, this third volume is exclusively devoted to the theory of STM and related SXM methods. As the experimental techniques including the reproducibility of the experimental results have advanced, more and more theorists have become attracted to focus on issues related to STM and SXM. The increasing effort in the development of theoretical concepts for STM/SXM has led to considerable improvements in understanding the contrast mechanism as well as the experimental conditions necessary to obtain reliable data. Therefore, this third volume on STM/SXM is not written by theorists for theorists, but rather for every scientist who is not satisfied by just obtaining real?? space images of surface structures by STM/SXM. After a brief introduction (Chap. 1), N. D. Lang first concentrates on theoretical concepts developed for understanding the STM image contrast for single-atom adsorbates on metals (Chap. 2). A scattering-theoretical approach to the STM is described by G. Doyen (Chap. 3). In Chap. 4, C. NClguera concentrates on the spectroscopic information obtained by STM, whereas the role of the tip atomic and electronic structure in STM/STS is examined more closely by M. Tsukada et al. in Chap. 5 |
| ISBN,Price | 9783642974700 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. ENGINEERING
4. Engineering, general
5. Materials???Surfaces
6. MICROSCOPY
7. SOLID STATE PHYSICS
8. SPECTROSCOPY
9. Spectroscopy and Microscopy
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02338 |
|
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On Shelf |
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294.
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| Title | Electronic Properties of Polymers : Orientation and Dimensionality of Conjugated Systems Proceedings of the International Winter School, Kirchberg, (Tyrol) Austria, March 9???16, 1991 |
| Author(s) | Kuzmany, Hans;Mehring, Michael;Roth, Siegmar |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1992. |
| Description | XIV, 498 p : online resource |
| Abstract Note | The International Winter School on Electronic Properties of Polymers Orien?? tation and Dimensionality of Conjugated Systems, held March 9-16, 1991, in Kirchberg, ('lYrol) Austria, was a sequel to three meetings on similar subjects held there. The 1991 winter school was again organized in cooperation with the "Bundesministerium fUr Wissenschaft und Forschung" in Austria, and with the "Bundesministerium fUr Forschung und Technologie" in the Federal Republic of Germany. The basic idea of the meeting was to provide an opportunity for experienced scientists from universities and industry to discuss their most re?? cent results and for students and young scientists to become familiar with the present status of research and applications in the field. Like the previous winter schools on polymers, this one concentrated on the electronic structure and potential~ for application of polymers with conjugated double bonds. This time, however, special attention was paid to the effects of orientation and dimensionality. Anisotropy of the electric conductivity in stretch-oriented samples and whether the transport mechanisms are one-, two-, or three-dimensional or might even have a "fractal dimensionality" were there?? fore central topics. The problem of orientation was extended to systems such as Langmuir-Blodgett films and other layered structures. Accordingly, thin films were the focus of most of the application oriented contributions. Whereas in the previous winter schools discussions on applications dealt with "large volume applications" such as electromagnetic shielding and energy storage, this time "molecular materials for electronics" and prospects of "molecular electronics" were at the center of interest |
| ISBN,Price | 9783642847059 |
| Keyword(s) | 1. Atomic, Molecular, Optical and Plasma Physics
2. ATOMS
3. EBOOK
4. EBOOK - SPRINGER
5. ELECTRONICS
6. Electronics and Microelectronics, Instrumentation
7. Materials???Surfaces
8. MICROELECTRONICS
9. PHYSICS
10. Polymer Sciences
11. Polymers????
12. Surfaces and Interfaces, Thin Films
13. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02331 |
|
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On Shelf |
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295.
|
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| Title | Semiconductor Interfaces: Formation and Properties : Proceedings of the Workkshop, Les Houches, France February 24???March 6, 1987 |
| Author(s) | LeLay, Guy;Derrien, Jacques;Boccara, Nino |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1987. |
| Description | XI, 389 p : online resource |
| Abstract Note | The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom?? mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel?? oped, powerful techniques such as scanning tunneling microscopy, high reso?? lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success |
| ISBN,Price | 9783642729676 |
| Keyword(s) | 1. CRYSTALLOGRAPHY
2. Crystallography and Scattering Methods
3. EBOOK
4. EBOOK - SPRINGER
5. Electronic materials
6. ELECTRONICS
7. Electronics and Microelectronics, Instrumentation
8. LASERS
9. Materials???Surfaces
10. MICROELECTRONICS
11. Optical and Electronic Materials
12. OPTICAL MATERIALS
13. Optics, Lasers, Photonics, Optical Devices
14. PHOTONICS
15. PHYSICAL CHEMISTRY
16. Surfaces and Interfaces, Thin Films
17. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02293 |
|
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On Shelf |
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296.
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|
| Title | Electrophotography and Development Physics |
| Author(s) | Schein, Lawrence B |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1992. |
| Description | XX, 363 p. 65 illus : online resource |
| Abstract Note | Electrophotography and Development Physics focuses on the complicated and increasingly important technology found in photocopiers and laser printers. An introduction chapter acquaints the reader with the technical history of electrophotography, its current and projected markets, and also alternative related copying and printing technologies. A concise descriptionof the physics of the complete electrophotgraphic process is followed by an in-depth treatment of static electricity. The three types of developmentsystems (two component, monocomponent, and liquid), and their associated charging mechanisms. In this second edition, a discussion of the new color copiers and a chapter updating the original material have been added. On mastering this material, which is presented in a manner suitable for both the newcomer and the established expert, the reader will have a workingknowledge of the electrophotographic process and a detailed knowledge of its important subsystem, development |
| ISBN,Price | 9783642777448 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. ELECTRONICS
5. Electronics and Microelectronics, Instrumentation
6. ENGINEERING
7. Engineering, general
8. Materials???Surfaces
9. MICROELECTRONICS
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. Surfaces and Interfaces, Thin Films
13. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02208 |
|
|
On Shelf |
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297.
|
|
| Title | Soft Matter Physics |
| Author(s) | Daoud, Mohamed;Williams, Claudine E |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1999. |
| Description | XVI, 320 p : online resource |
| Abstract Note | What do colloids, fractals, liquid crystals, and polymers have in common? Nothing at first sight. Yet the distance scales, the energy transfers, the way these objects react to an external field are very similar. For the first time, this book offers an introduction to the physics of these soft materials in one single volume. A variety of experiments and concepts are presented, including the phenomena of capillarity and wetting, fractals, small volumes and large surfaces, colloids, surfactants, giant micelles and fluid membranes, polymers, and liquid crystals. Each chapter is written by experts in the field with the aim of making the book accessible to the widest possible scientific audience: graduate students, lecturers, and research scientists in physics, chemistry, and other disciplines. Nobel Prize winner Pierre-Gilles de Gennes inspired this book and has written a foreword |
| ISBN,Price | 9783662038451 |
| Keyword(s) | 1. Amorphous substances
2. Complex fluids
3. CONDENSED MATTER
4. CONDENSED MATTER PHYSICS
5. EBOOK
6. EBOOK - SPRINGER
7. Materials???Surfaces
8. PHYSICAL CHEMISTRY
9. Polymer Sciences
10. Polymers????
11. Soft and Granular Matter, Complex Fluids and Microfluidics
12. Surfaces and Interfaces, Thin Films
13. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02181 |
|
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On Shelf |
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298.
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| Title | Hydrogen in Intermetallic Compounds II : Surface and Dynamic Properties, Applications |
| Author(s) | Schlapbach, Louis |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1992. |
| Description | XIV, 328 p : online resource |
| Abstract Note | The topic of hydrogen in an on metals and alloys is important in a number ofdisciplines including solid-state physics, materials science, physical chemistry, and energy technology. This volume treats the dynamics of hydrogen in intermetallic compounds, surface properties, kinetics, and applications of metal hydrides in energy technology. In addition, selected experimental methods are described. The introductory chapter will enable non-specialists to gain an overall picture of the field and to appreciate the relevant scientific issue. The companion volume, Hydrogene in Intermetallic Compounds I, was published as Vol. 63 of Topics in Applied Physics |
| ISBN,Price | 9783540464334 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Materials???Surfaces
4. Surfaces and Interfaces, Thin Films
5. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02177 |
|
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On Shelf |
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299.
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| Title | Surface Science : Principles and Current Applications |
| Author(s) | MacDonald, R.J;Taglauer, Edmund C;Wandelt, Klaus |
| Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1996. |
| Description | X, 374 p. 35 illus : online resource |
| Abstract Note | Modern technologies increasingly rely on low-dimensional physics at interfaces and in thin-films and nano-structures. Surface science holds a key position in providing the experimental methods and theoretical models for a basic understanding of these effects. This book includes case studies and status reports about research topics such as: surface structure determination by tensor-LEED and surface X-ray diffraction; the preparation and detection of low-dimensional electronic surface states; quantitative surface compositional analysis; the dynamics of adsorption and reaction of adsorbates, e.g. kinetic oscillations; the characterization and control of thin-film and multilayer growth including the influence of surfactants; a critical assessment of the surface physics approach to heterogeneous catalysis |
| ISBN,Price | 9783642802812 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Interfaces (Physical sciences)
4. Materials???Surfaces
5. Surface and Interface Science, Thin Films
6. Surfaces (Physics)
7. Surfaces and Interfaces, Thin Films
8. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02168 |
|
|
On Shelf |
|
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300.
| |
| Title | Ellipsometry for Industrial Applications |
| Author(s) | Riedling, Karl |
| Publication | Vienna, Springer Vienna, 1988. |
| Description | XIII, 99 p. 49 illus : online resource |
| Abstract Note | During the past years, elliposometry, a non-destructive and contact-less optical surface analysis technique, has gained increased importance in industrial areas, such as the technology of electronic devices, when simple instruments, many of them computer-controlled and automated, became available. The potential users of such instruments are, however, frequently aware neither of the inherent possibilities of this technique, nor of its accuracy limitations. This book endeavors to point out some of the less obvious features and possibilities of ellipsometry, particularly of dynamic "in situ" measurements, and reviews its applications in research and manufacturing of semiconductor and thin film devices. A comprehensive discussion of various error effects typical particularly for simple ellipsometers and of their impact on measured sample parameters is provided. Error correction or (numerical) calibration procedures are given wherever possible, and design and operation guidelines for high-speed instruments suitable for dynamic "in situ" measurements are suggested |
| ISBN,Price | 9783709189610 |
| Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. ELECTRONICS
5. Electronics and Microelectronics, Instrumentation
6. LASERS
7. Materials???Surfaces
8. MICROELECTRONICS
9. MICROSCOPY
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. Optics, Lasers, Photonics, Optical Devices
13. PHOTONICS
14. SOLID STATE PHYSICS
15. SPECTROSCOPY
16. Spectroscopy and Microscopy
17. Surfaces and Interfaces, Thin Films
18. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I02086 |
|
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On Shelf |
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