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 #  AuthorTitleAccn#YearItem Type Claims
331 Daillant, Jean X-Ray and Neutron Reflectivity: Principles and Applications I00097 1999 eBook  
332 Wiesendanger, Roland Scanning Tunneling Microscopy II I00041 1995 eBook  
333 Yonezawa, F Fundamental Physics of Amorphous Semiconductors I00035 1981 eBook  
334 Eckstein, Wolfgang Computer Simulation of Ion-Solid Interactions I00030 1991 eBook  
335 Thieme, J??rgen X-Ray Microscopy and Spectromicroscopy I00028 1998 eBook  
(page:34 / 34) [#335] First Page   Previous Page    

331.    
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TitleX-Ray and Neutron Reflectivity: Principles and Applications
Author(s)Daillant, Jean;Gibaud, Alain
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 1999.
DescriptionXXIII, 331 p : online resource
Abstract NoteThe book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students
ISBN,Price9783540486961
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. Materials???Surfaces 4. MICROSCOPY 5. Particle acceleration 6. Particle Acceleration and Detection, Beam Physics 7. SOLID STATE PHYSICS 8. SPECTROSCOPY 9. Spectroscopy and Microscopy 10. Surfaces and Interfaces, Thin Films 11. THIN FILMS
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I00097     On Shelf    

332.     
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TitleScanning Tunneling Microscopy II : Further Applications and Related Scanning Techniques
Author(s)Wiesendanger, Roland;G??ntherodt, Hans-Joachim
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 1995.
DescriptionXIV, 349 p. 91 illus., 2 illus. in color : online resource
Abstract NoteScanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed
ISBN,Price9783642793660
Keyword(s)1. CELL BIOLOGY 2. EBOOK 3. EBOOK - SPRINGER 4. ENGINEERING 5. Engineering, general 6. Materials???Surfaces 7. MICROSCOPY 8. PHYSICAL CHEMISTRY 9. SOLID STATE PHYSICS 10. SPECTROSCOPY 11. Spectroscopy and Microscopy 12. Surfaces and Interfaces, Thin Films 13. THIN FILMS
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I00041     On Shelf    

333.     
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TitleFundamental Physics of Amorphous Semiconductors : Proceedings of the Kyoto Summer Institute Kyoto, Japan, September 8???11, 1980
Author(s)Yonezawa, F
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 1981.
DescriptionVIII, 184 p. 5 illus : online resource
Abstract NoteThe Kyoto Summer Institute 1980 (KSI '80), devoted to "Fundamental Physics of Amorphous Semiconductors", was held at Research Institute for Fundamental Physics (RIFP), Kyoto University, from 8-11 September, 1980. The KSI '80 was the successor of the preceding Institutes which were held in July 1978 on "Particle Physics and Accelerator Projects" and in September 1979 on "Physics of Low-Dimensional Systems". The KSI '80 was attended by 200 participants, of which 36 were from abroad: Canada, France, Korea, Poland, U.K., U.S.A, U.S.S.R., and the Federal Republic of Germany. The KSI '80 was organized by RIFP and directed by the Amorphous Semicon?? ductor group in Japan. A few years ago, we started to organize an interna?? tional meeting on amorphous semiconductors' as a satell ite meeting of the International Conference on "Physics of Semiconductors" held on September 1-5, 1980 in Kyoto. We later decided to hold the meeting in the form of the Kyoto Summer Institute. The Kyoto Summer Institute is aimed to be something between a school and a conference. Accordingly, the object of the KSI '80 was to provide a series of invited lectures and informal seminars on fundamental physics of amorphous semiconductors. No contributed paper was accepted, but seminars were open
ISBN,Price9783642816048
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. Materials???Surfaces 4. Surfaces and Interfaces, Thin Films 5. THIN FILMS
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I00035     On Shelf    

334.     
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TitleComputer Simulation of Ion-Solid Interactions
Author(s)Eckstein, Wolfgang
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 1991.
DescriptionXI, 296 p : online resource
Abstract NoteIn this book the author discusses the investigation of ion bombardment of solids by computer simulation, with the aim of demonstrating the usefulness of this approach to the problem of interactions of ions with solids. The various chapters present the basic physics behind the simulation programs, their structure and many applications to different topics. The two main streams, the binary collision model and the classical dynamics model, are discussed, as are interaction potentials and electronic energy losses. The main topics investigated are backscattering, sputtering and implantation for incident atomic particles with energies from the eV to the MeV range. An extensive overview of the literature is given, making this book of interest to the active reseacher as well to students entering the field
ISBN,Price9783642735134
Keyword(s)1. EBOOK 2. EBOOK - SPRINGER 3. Materials???Surfaces 4. Mathematical Methods in Physics 5. MICROSCOPY 6. Numerical and Computational Physics, Simulation 7. PHYSICS 8. SOLID STATE PHYSICS 9. SPECTROSCOPY 10. Spectroscopy and Microscopy 11. Surfaces and Interfaces, Thin Films 12. THIN FILMS
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I00030     On Shelf    

335.    
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TitleX-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, W??rzburg, August 19???23, 1996
Author(s)Thieme, J??rgen;Schmahl, G??nter;Rudolph, Dietbert;Umbach, Eberhard
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 1998.
DescriptionXIX, 383 p. 400 illus : online resource
Abstract NoteThis book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies
ISBN,Price9783642721069
Keyword(s)1. Biological and Medical Physics, Biophysics 2. BIOLOGICAL PHYSICS 3. BIOPHYSICS 4. CRYSTALLOGRAPHY 5. Crystallography and Scattering Methods 6. EBOOK 7. EBOOK - SPRINGER 8. LASERS 9. Materials???Surfaces 10. Optics, Lasers, Photonics, Optical Devices 11. PHOTONICS 12. Surfaces and Interfaces, Thin Films 13. THIN FILMS
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I00028     On Shelf    

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