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11 Fan, Tian-You Generalized Dynamics of Soft-Matter Quasicrystals I09986 2017 eBook  
12 Hepting, Matthias Ordering Phenomena in Rare-Earth Nickelate Heterostructures I09974 2017 eBook  
13 Sadewasser, Sascha Kelvin Probe Force Microscopy I09919 2018 eBook  
14 Stenzel, Olaf Optical Characterization of Thin Solid Films I09918 2018 eBook  
15 Tachibana, Makoto Beginner???s Guide to Flux Crystal Growth I09900 2017 eBook  
16 Walstedt, Russell E The NMR Probe of High-Tc Materials and Correlated Electron Systems I09899 2018 eBook  
17 Celano, Umberto Metrology and Physical Mechanisms in New Generation Ionic Devices I09851 2016 eBook  
18 Huang, Songling New Technologies in Electromagnetic Non-destructive Testing I09771 2016 eBook  
19 Vesel??, Jozef Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms I09735 2017 eBook  
20 Rocca, Mario Springer Handbook of Surface Science I09728 2020 eBook  
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11.    
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TitleGeneralized Dynamics of Soft-Matter Quasicrystals : Mathematical models and solutions
Author(s)Fan, Tian-You
PublicationSingapore, 1. Imprint: Springer 2. Springer Singapore, 2017.
DescriptionXVI, 184 p. 54 illus., 45 illus. in color : online resource
Abstract NoteThe book systematically introduces the mathematical models and solutions of generalized hydrodynamics of soft-matter quasicrystals (SMQ). It provides methods for solving the initial-boundary value problems in these systems. The solutions obtained demonstrate the distribution, deformation and motion of the soft-matter quasicrystals, and determine the stress, velocity and displacement fields. The interactions between phonons, phasons and fluid phonons are discussed in some fundamental materials samples. Mathematical solutions for solid and soft-matter quasicrystals are compared, to help readers to better understand the featured properties of SMQ
ISBN,Price9789811049507
Keyword(s)1. Amorphous substances 2. Characterization and Evaluation of Materials 3. Complex fluids 4. EBOOK 5. EBOOK - SPRINGER 6. MATERIALS SCIENCE 7. Mathematical Methods in Physics 8. MECHANICS 9. Mechanics, Applied 10. PHYSICS 11. Soft and Granular Matter, Complex Fluids and Microfluidics 12. Solid Mechanics
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12.     
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TitleOrdering Phenomena in Rare-Earth Nickelate Heterostructures
Author(s)Hepting, Matthias
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2017.
DescriptionXVI, 147 p. 63 illus., 56 illus. in color : online resource
Abstract NoteThis thesis presents an experimental study of ordering phenomena in rare-earth nickelate-based heterostructures by means of inelastic Raman light scattering and elastic resonant x-ray scattering (RXS). Further, it demonstrates that the amplitude ratio of magnetic moments at neighboring nickel sites can be accurately determined by RXS in combination with a correlated double cluster model, and controlled experimentally through structural pinning of the oxygen positions in the crystal lattice. The two key outcomes of the thesis are: (a) demonstratingfull control over the charge/bond and spin order parameters in specifically designed praseodymium nickelate heterostructures and observation of a novel spin density wave phase in absence of the charge/bond order parameter, which confirms theoretical predictions of a spin density wave phase driven by spatial confinement of the conduction electrons; and (b) assessing the thickness-induced crossover between collinear and non-collinear spin structures in neodymium nickelate slabs, which is correctly predicted by drawing on density functional theory.
ISBN,Price9783319605319
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. Interfaces (Physical sciences) 5. MATERIALS SCIENCE 6. MICROSCOPY 7. SPECTROSCOPY 8. Spectroscopy and Microscopy 9. Strongly Correlated Systems, Superconductivity 10. SUPERCONDUCTIVITY 11. SUPERCONDUCTORS 12. Surface and Interface Science, Thin Films 13. Surfaces (Physics) 14. THIN FILMS
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13.     
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TitleKelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
Author(s)Sadewasser, Sascha;Glatzel, Thilo
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2018.
DescriptionXXIV, 521 p. 234 illus., 194 illus. in color : online resource
Abstract NoteThis book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors??? previous volume ???Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,??? presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field
ISBN,Price9783319756875
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Materials???Surfaces 6. Measurement Science and Instrumentation 7. Measurement?????? 8. MICROSCOPY 9. NANOTECHNOLOGY 10. Nanotechnology and Microengineering 11. PHYSICAL MEASUREMENTS 12. SPECTROSCOPY 13. Spectroscopy and Microscopy 14. Surfaces and Interfaces, Thin Films 15. THIN FILMS
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14.     
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TitleOptical Characterization of Thin Solid Films
Author(s)Stenzel, Olaf;Ohl??dal, Miloslav
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2018.
DescriptionXXIV, 462 p : online resource
Abstract NoteThis book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects
ISBN,Price9783319753256
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. Electronic materials 5. Interfaces (Physical sciences) 6. MATERIALS SCIENCE 7. Materials???Surfaces 8. MICROSCOPY 9. Optical and Electronic Materials 10. OPTICAL MATERIALS 11. SPECTROSCOPY 12. Spectroscopy and Microscopy 13. Surface and Interface Science, Thin Films 14. Surfaces (Physics) 15. Surfaces and Interfaces, Thin Films 16. THIN FILMS
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15.     
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TitleBeginner???s Guide to Flux Crystal Growth
Author(s)Tachibana, Makoto
PublicationTokyo, 1. Imprint: Springer 2. Springer Japan, 2017.
DescriptionIX, 130 p. 63 illus., 41 illus. in color : online resource
Abstract NoteThis book introduces the principles and techniques of crystal growth by the flux method, which is arguably the most useful way to obtain millimeter- to centimeter-sized single crystals for physical research. As it is possible to find an appropriate solvent (???flux???) for nearly all inorganic materials, the flux method can be applied to the growth of many crystals ranging from transition metal oxides to intermetallic compounds. Both important principles and experimental procedures are described in a clear and accessible manner. Practical advice on various aspects of the experiment, which is not readily available in the literature, will assist the beginning graduate students in setting up the lab and conducting successful crystal growth. The mechanisms of crystal growth at an elementary level are also provided to better understand the techniques and to help in assessing the quality of the crystals. The book also contains many photographs of beautiful crystals with important physical properties of current interest, such as high-temperature superconductors, strongly correlated electronic systems, topological insulators, relaxor ferroelectrics, low-dimensional quantum magnets, non-linear optical materials, and multiferroics
ISBN,Price9784431565871
Keyword(s)1. Characterization and Evaluation of Materials 2. CRYSTALLOGRAPHY 3. Crystallography and Scattering Methods 4. EBOOK 5. EBOOK - SPRINGER 6. Electronic materials 7. INORGANIC CHEMISTRY 8. MATERIALS SCIENCE 9. Optical and Electronic Materials 10. OPTICAL MATERIALS
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16.     
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TitleThe NMR Probe of High-Tc Materials and Correlated Electron Systems
Author(s)Walstedt, Russell E
PublicationBerlin, Heidelberg, 1. Imprint: Springer 2. Springer Berlin Heidelberg, 2018.
DescriptionXIII, 323 p. 124 illus., 13 illus. in color : online resource
Abstract NoteThis new edition updates readers in three areas of NMR studies, namely,??recent developments in high-Tc materials, heavy fermion systems and actinide oxides are presented. ??The NMR probe has yielded a vast array of data for solid state materials, corresponding to different compounds, ionic sites, and nuclear species, as well as to a wide variety of experimental conditions. The last two parts of the book are completely new in this??edition, while the first part has seen major updates. This??edition features the latest developments for high-Tc materials, especially the advances in the area of pseudogap studies are reviewed.?? An in depth overview of heavy fermion systems is presented in the second part,?? notably Kondo lattices, quantum critical points and unconventional superconductivity are areas of intense research recently and are covered extensively. Finally, valuable information from NMR studies with actinide oxides will be provided. Ongoing analysis and discussion of NMR data have resulted in a wealth of important insights into the physics of these exotic systems. The aims of this monograph are manifold. First, it reviews NMR methodology as it has been applied to the different studies. This is addressed to NMR practitioners and to physics laypersons alike. Next, it presents a review of NMR measurements and the wide variety of phenomena which they represent. The third phase is to recount the theoretical model calculations and other proposals which have been put forward to account for these data
ISBN,Price9783662555828
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Measurement Science and Instrumentation 6. Measurement?????? 7. PHYSICAL MEASUREMENTS 8. SOLID STATE PHYSICS 9. Strongly Correlated Systems, Superconductivity 10. SUPERCONDUCTIVITY 11. SUPERCONDUCTORS
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17.     
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TitleMetrology and Physical Mechanisms in New Generation Ionic Devices
Author(s)Celano, Umberto
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2016.
DescriptionXXIV, 175 p. 96 illus., 18 illus. in color : online resource
Abstract NoteThe thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
ISBN,Price9783319395319
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. MICROSCOPY 6. NANOTECHNOLOGY 7. Nanotechnology and Microengineering 8. SPECTROSCOPY 9. Spectroscopy and Microscopy
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18.     
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TitleNew Technologies in Electromagnetic Non-destructive Testing
Author(s)Huang, Songling;Wang, Shen
PublicationSingapore, 1. Imprint: Springer 2. Springer Singapore, 2016.
DescriptionX, 222 p. 193 illus., 146 illus. in color : online resource
Abstract NoteThis book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applications of the electromagnetic NDT technology. It could serve as a valuable reference for college students and relevant NDT technicians. It is also a useful material for qualification training and higher learning for nondestructive testing professionals
ISBN,Price9789811005787
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. ELECTRONIC CIRCUITS 5. Electronic Circuits and Devices 6. MAGNETIC MATERIALS 7. MAGNETISM 8. Magnetism, Magnetic Materials 9. MATERIALS SCIENCE 10. Measurement Science and Instrumentation 11. Measurement?????? 12. MECHANICS 13. Mechanics, Applied 14. PHYSICAL MEASUREMENTS 15. Solid Mechanics
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19.     
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TitleNanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms
Author(s)Vesel??, Jozef
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2017.
DescriptionXIV, 100 p. 86 illus., 21 illus. in color : online resource
Abstract NoteThis thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations
ISBN,Price9783319483023
Keyword(s)1. Characterization and Evaluation of Materials 2. CONDENSED MATTER 3. CONDENSED MATTER PHYSICS 4. EBOOK 5. EBOOK - SPRINGER 6. MATERIALS SCIENCE 7. MICROSCOPY 8. Numerical and Computational Physics, Simulation 9. PHYSICS 10. SPECTROSCOPY 11. Spectroscopy and Microscopy
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20.    
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TitleSpringer Handbook of Surface Science
Author(s)Rocca, Mario;Rahman, Talat;Vattuone, Luca
PublicationCham, 1. Imprint: Springer 2. Springer International Publishing, 2020.
DescriptionXXXII, 1260 p. 840 illus. in color : online resource
Abstract NoteThis handbook delivers an up-to-date, comprehensive and authoritative coverage of the broad field of surface science, encompassing a range of important materials such metals, semiconductors, insulators, ultrathin films and supported nanoobjects. Over 100 experts from all branches of experiment and theory review in 39 chapters all major aspects of solid-state surfaces, from basic principles to applications, including the latest, ground-breaking research results. Beginning with the fundamental background of kinetics and thermodynamics at surfaces, the handbook leads the reader through the basics of crystallographic structures and electronic properties, to the advanced topics at the forefront of current research. These include but are not limited to novel applications in nanoelectronics, nanomechanical devices, plasmonics, carbon films, catalysis, astrochemistry and biology. The handbook is an ideal reference guide and instructional aid for a wide range of physicists, chemists, materials scientists and engineers active throughout academic and industrial research
ISBN,Price9783030469061
Keyword(s)1. Characterization and Evaluation of Materials 2. CRYSTALLOGRAPHY 3. Crystallography and Scattering Methods 4. EBOOK 5. EBOOK - SPRINGER 6. Interfaces (Physical sciences) 7. MATERIALS SCIENCE 8. Materials???Surfaces 9. Measurement Science and Instrumentation 10. Measurement?????? 11. Nanoscale science 12. Nanoscale Science and Technology 13. NANOSCIENCE 14. Nanostructures 15. PHYSICAL MEASUREMENTS 16. Surface and Interface Science, Thin Films 17. Surfaces (Physics) 18. Surfaces and Interfaces, Thin Films 19. THIN FILMS
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