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31 Gupta, S. V Units of Measurement I09509 2020 eBook  
32 Dapor, Maurizio Transport of Energetic Electrons in Solids I09496 2020 eBook  
33 Jhang, Kyung-Young Measurement of Nonlinear Ultrasonic Characteristics I09487 2020 eBook  
34 Su, Ching-Hua Vapor Crystal Growth and Characterization I09486 2020 eBook  
35 Vogler, Tracy J Shock Phenomena in Granular and Porous Materials I09398 2019 eBook  
36 Barber, Mark Edward Uniaxial Stress Technique and Investigations of Correlated Electron Systems I09362 2018 eBook  
37 Oral, Ahmet Yavuz 3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM) I09348 2017 eBook  
38 Gupta, S. V Mass Metrology I09290 2019 eBook  
39 Fu, Mengqi Electrical Properties of Indium Arsenide Nanowires and Their Field-Effect Transistors I09283 2018 eBook  
40 Morelh??o, S??rgio Luiz Computer Simulation Tools for X-ray Analysis I09254 2016 eBook  
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31.    
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TitleUnits of Measurement : History, Fundamentals and Redefining the SI Base Units
Author(s)Gupta, S. V
PublicationCham, Springer International Publishing, 2020.
DescriptionXXIII, 304 p. 122 illus., 20 illus. in color : online resource
Abstract NoteThis book delivers a comprehensive overview of units of measurement. Beginning with a historical look at metrology in Ancient India, the book explains fundamental concepts in metrology such as basic, derived and dimensionless quantities, and introduces the concept of quantity calculus. It discusses and critically examines various three and four-dimensional systems of units used both presently and in the past, while explaining why only four base units are needed for a system of measurement. It discusses the Metre Convention as well as the creation of the International Bureau of Weights and Measures, and gives a detailed look at the evolution of the current SI base units of time, length, mass, electric current, temperature, intensity of illumination and substance. This updated second edition is extended with timely new chapters discussing past efforts to redefine the SI base units as well as the most recent 2019 redefinitions based entirely on the speed of light and other fundamental physical constants. Additionally, it provides biographical presentations of many of the historical figures behind commonly used units of measurements, such as Newton, Joule and Ohm, With its accessible and comprehensive treatment of the field, together with its unique presentation of the underlying history, this book is well suited to any student and researcher interested in the practical and historical aspects of the field of metrology
ISBN,Price9783030439699
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. ENGINEERING 5. Engineering, general 6. History and Philosophical Foundations of Physics 7. MATERIALS SCIENCE 8. Measurement Science and Instrumentation 9. Measurement?????? 10. PHYSICAL MEASUREMENTS 11. PHYSICS
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32.     
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TitleTransport of Energetic Electrons in Solids : Computer Simulation with Applications to Materials Analysis and Characterization
Author(s)Dapor, Maurizio
PublicationCham, Springer International Publishing, 2020.
DescriptionXIX, 219 p. 67 illus., 2 illus. in color : online resource
Abstract NoteThis book describes, as simply as possible, the mechanisms of scattering (both elastic and inelastic) of electrons with solid targets (electron???atom, electron???plasmon, and electron???phonon interactions). It also presents the main strategies of the Monte Carlo method, as well as numerous comparisons between simulation results and the experimental data available in the literature. Furthermore it provides readers with all the information they need in order to write their own Monte Carlo code and to compare the obtained results with the many numerical and experimental examples presented throughout the book. An extended and updated third edition of a work published in 2014 (first edition) and in 2017 (second edition) on the application of the Monte Carlo method to the transport of fast electrons in solids, this book includes, as novel topics, the theory of polarized electron beams (i.e. density matrix and spin polarization), the study of elastic scattering by molecules, a classical treatment of the Bethe-Bloch stopping power, a simple derivation of the f- and ps-sum rules, the Vicanek and Urbassek formula for the calculation of the backscattering coefficient, the Wolff theory describing the secondary electron spectra, and fundamental aspects of the interactions between electrons beams and solid targets. Further, it describes a completely analytical approach (the so-called multiple reflection method) for calculating the absorbed, backscattered, and transmitted fractions of electrons from unsupported and supported thin films. It also discusses recent applications of the Monte Carlo method
ISBN,Price9783030432645
Keyword(s)1. APPLIED MATHEMATICS 2. Characterization and Evaluation of Materials 3. EBOOK 4. EBOOK - SPRINGER 5. ENGINEERING MATHEMATICS 6. MATERIALS SCIENCE 7. Mathematical and Computational Engineering 8. Numerical and Computational Physics, Simulation 9. Particle acceleration 10. Particle Acceleration and Detection, Beam Physics 11. PHYSICS 12. SOLID STATE PHYSICS
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33.     
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TitleMeasurement of Nonlinear Ultrasonic Characteristics
Author(s)Jhang, Kyung-Young;Lissenden, Cliff J;Solodov, Igor;Ohara, Yoshikazu;Gusev, Vitalyi
PublicationSingapore, Springer Singapore, 2020.
DescriptionX, 287 p : online resource
Abstract NoteConventional ultrasonic methods based on ultrasonic characteristics in the linear elastic region are mainly sensitive to mature defects but are much less responsive to micro-damage or incipient material degradation. Recently, nonlinear ultrasonic characteristics beyond the linear ultrasonic amplitude range have been studied as a method for overcoming this limitation, and hence, many researchers are engaged in theoretical, experimental, and various application studies. However, the nonlinear ultrasonic characteristics are quite exacting compared to the linear phenomena so that they require vast experience and high proficiency in order to obtain proper experimental data. Actually, many researchers, especially beginners including graduate students, have difficulty in reliably measuring nonlinear ultrasonic characteristics. This book provides key technological know-how from experts with years of experience in this field, which will help researchers and engineers to obtain a clear understanding and high quality data in the nonlinear ultrasonic experiments and applications
ISBN,Price9789811514616
Keyword(s)1. ACOUSTICS 2. Characterization and Evaluation of Materials 3. EBOOK 4. EBOOK - SPRINGER 5. MATERIALS SCIENCE 6. Measurement Science and Instrumentation 7. Measurement?????? 8. PHYSICAL MEASUREMENTS
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34.     
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TitleVapor Crystal Growth and Characterization : ZnSe and Related II???VI Compound Semiconductors
Author(s)Su, Ching-Hua
PublicationCham, Springer International Publishing, 2020.
DescriptionXVI, 215 p. 178 illus., 75 illus. in color : online resource
Abstract NoteThe book describes developments in the crystal growth of bulk II-VI semiconductor materials. A fundamental, systematic, and in-depth study of the physical vapor transport (PVT) growth process is the key to producing high-quality single crystals of semiconductors. As such, the book offers a comprehensive overview of the extensive studies on ZnSe and related II-VI wide bandgap compound semiconductors, such as CdS, CdTe, ZnTe, ZnSeTe and ZnSeS. Further, it shows the detailed steps for the growth of bulk crystals enabling optical devices which can operate in the visible spectrum for applications such as blue light emitting diodes, lasers for optical displays and in the mid-IR wavelength range, high density recording, and military communications. The book then discusses the advantages of crystallization from vapor compared to the conventional melt growth: lower processing temperatures, the purification process associated with PVT, and the improved surface morphology of the grown crystals, as well as the necessary drawbacks to the PVT process, such as the low and inconsistent growth rates and the low yield of single crystals. By presenting in-situ measurements of transport rate, partial pressures and interferometry, as well as visual observations, the book provides detailed insights into in the kinetics during the PVT process. This book is intended for graduate students and professionals in materials science as well as engineers preparing and developing optical devices with semiconductors
ISBN,Price9783030396558
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. Engineering???Materials 5. Materials Engineering 6. MATERIALS SCIENCE 7. Particle acceleration 8. Particle Acceleration and Detection, Beam Physics 9. SEMICONDUCTORS
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35.     
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TitleShock Phenomena in Granular and Porous Materials
Author(s)Vogler, Tracy J;Fredenburg, D. Anthony
PublicationCham, Springer International Publishing, 2019.
DescriptionXI, 294 p. 140 illus., 114 illus. in color : online resource
Abstract NoteGranular forms of common materials such as metals and ceramics, sands and soils, porous energetic materials (explosives, reactive mixtures), and foams exhibit interesting behaviors due to their heterogeneity and critical length scale, typically commensurate with the grain or pore size. Under extreme conditions of impact, granular and porous materials display highly localized phenomena such as fracture, inelastic deformation, and the closure of voids, which in turn strongly influence the bulk response. Due to the complex nature of these interactions and the short time scales involved, computational methods have proven to be powerful tools to investigate these phenomena. Thus, the coupled use of experiment, theory, and simulation is critical to advancing our understanding of shock processes in initially porous and granular materials. This is a comprehensive volume on granular and porous materials for researchers working in the area of shock and impact physics. The book is divided into three sections, where the first presents the fundamentals of shock physics as it pertains to the equation of state, compaction, and strength properties of porous materials. Building on these fundamentals, the next section examines several applications where dynamic processes involving initially porous materials are prevalent, focusing on the areas of penetration, planetary impact, and reactive munitions. The final section provides a look at emerging areas in the field, where the expansion of experimental and computational capabilities are opening the door for new opportunities in the areas of advanced light sources, molecular dynamics modeling, and additively manufactured porous structures. By intermixing experiment, theory, and simulation throughout, this book serves as an excellent, up-to-date desk reference for those in the field of shock compression science of porous and granular materials.
ISBN,Price9783030230029
Keyword(s)1. Amorphous substances 2. Characterization and Evaluation of Materials 3. Complex fluids 4. EBOOK 5. EBOOK - SPRINGER 6. MATERIALS SCIENCE 7. MECHANICS 8. Mechanics, Applied 9. Numerical and Computational Physics, Simulation 10. PHYSICS 11. Soft and Granular Matter, Complex Fluids and Microfluidics 12. Solid Mechanics
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36.     
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TitleUniaxial Stress Technique and Investigations of Correlated Electron Systems
Author(s)Barber, Mark Edward
PublicationCham, Springer International Publishing, 2018.
DescriptionXII, 190 p. 119 illus., 88 illus. in color : online resource
Abstract NoteThis book reports on the development and application of a new uniaxial pressure apparatus that is currently generating considerable interest in the field of materials physics. The author provides practical guidelines for performing related experiments, backed up by finite element simulations. Subsequently, the book reports on two uses of the device. In the first, high pressures are used to tune to a Van Hove singularity in Sr2RuO4, while the effects on the unconventional superconductivity and the normal state properties are investigated. In the second experiment, precise and continuous strain control is used to probe symmetry breaking and novel phase formation in the vicinity of a quantum critical point in Sr3Ru2O7.
ISBN,Price9783319939735
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Measurement Science and Instrumentation 6. Measurement?????? 7. PHYSICAL MEASUREMENTS 8. SOLID STATE PHYSICS 9. Strongly Correlated Systems, Superconductivity 10. SUPERCONDUCTIVITY 11. SUPERCONDUCTORS
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37.     
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Title3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM) : Proceedings, Oludeniz, Turkey, 19-23 October 2015
Author(s)Oral, Ahmet Yavuz;Bahsi Oral, Zehra Banu
PublicationCham, Springer International Publishing, 2017.
DescriptionXX, 255 p. 147 illus., 92 illus. in color : online resource
Abstract NoteThe 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available
ISBN,Price9783319466019
Keyword(s)1. Biological and Medical Physics, Biophysics 2. Biological Microscopy 3. BIOLOGICAL PHYSICS 4. BIOPHYSICS 5. Characterization and Evaluation of Materials 6. EBOOK 7. EBOOK - SPRINGER 8. MATERIALS SCIENCE 9. MICROSCOPY 10. SPECTROSCOPY 11. Spectroscopy and Microscopy 12. Spectroscopy/Spectrometry
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38.     
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TitleMass Metrology : The Newly Defined Kilogram
Author(s)Gupta, S. V
PublicationCham, Springer International Publishing, 2019.
DescriptionXXIV, 453 p. 149 illus., 11 illus. in color : online resource
Abstract NoteThis second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck???s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro???s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck???s constant
ISBN,Price9783030124656
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. MATERIALS SCIENCE 5. Measurement Science and Instrumentation 6. Measurement?????? 7. MECHANICS 8. Mechanics, Applied 9. PHYSICAL MEASUREMENTS 10. Theoretical and Applied Mechanics
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39.     
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TitleElectrical Properties of Indium Arsenide Nanowires and Their Field-Effect Transistors
Author(s)Fu, Mengqi
PublicationSingapore, Springer Singapore, 2018.
DescriptionXV, 102 p. 68 illus., 57 illus. in color : online resource
Abstract NoteThis book explores the impacts of important material parameters on the electrical properties of indium arsenide (InAs) nanowires, which offer a promising channel material for low-power electronic devices due to their small bandgap and high electron mobility. Smaller diameter nanowires are needed in order to scale down electronic devices and improve their performance. However, to date the properties of thin InAs nanowires and their sensitivity to various factors were not known. The book presents the first study of ultrathin InAs nanowires with diameters below 10 nm are studied, for the first time, establishing the channel in field-effect transistors (FETs) and the correlation between nanowire diameter and device performance. Moreover, it develops a novel method for directly correlating the atomic-level structure with the properties of individual nanowires and their device performance. Using this method, the electronic properties of InAs nanowires and the performance of the FETs they are used in are found to change with the crystal phases (wurtzite, zinc-blend or a mix phase), the axis direction and the growth method. These findings deepen our understanding of InAs nanowires and provide a potential way to tailor device performance by controlling the relevant parameters of the nanowires and devices
ISBN,Price9789811334443
Keyword(s)1. Characterization and Evaluation of Materials 2. EBOOK 3. EBOOK - SPRINGER 4. ELECTRONIC CIRCUITS 5. Electronic Circuits and Devices 6. Electronic materials 7. MATERIALS SCIENCE 8. Nanoscale science 9. Nanoscale Science and Technology 10. NANOSCIENCE 11. Nanostructures 12. NANOTECHNOLOGY 13. Nanotechnology and Microengineering 14. Optical and Electronic Materials 15. OPTICAL MATERIALS 16. SEMICONDUCTORS
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40.    
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TitleComputer Simulation Tools for X-ray Analysis : Scattering and Diffraction Methods
Author(s)Morelh??o, S??rgio Luiz
PublicationCham, Springer International Publishing, 2016.
DescriptionXV, 294 p. 105 illus., 104 illus. in color : online resource
Abstract NoteThe main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analyzing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks. In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools
ISBN,Price9783319195544
Keyword(s)1. Characterization and Evaluation of Materials 2. CRYSTALLOGRAPHY 3. Crystallography and Scattering Methods 4. EBOOK 5. EBOOK - SPRINGER 6. MATERIALS SCIENCE 7. Numerical and Computational Physics, Simulation 8. PHYSICAL CHEMISTRY 9. PHYSICS
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