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Author | Title | Accn# | Year | Item Type | Claims |
511 |
An-Ben Chen |
Semiconductor Alloys |
I01767 |
1995 |
eBook |
|
512 |
Pryor, Roger W |
Disorder and Order in the Solid State |
I01740 |
1988 |
eBook |
|
513 |
Li, Sheng S |
Semiconductor Physical Electronics |
I01653 |
1993 |
eBook |
|
514 |
Seeger, Karlheinz |
Semiconductor Physics |
I01594 |
1991 |
eBook |
|
515 |
Ferbel, Thomas |
Techniques and Concepts of High-Energy Physics VIII |
I01582 |
1995 |
eBook |
|
516 |
Tsidilkovski, J |
Electron Spectrum of Gapless Semiconductors |
I01577 |
1997 |
eBook |
|
517 |
Kressel, H |
Semiconductor Devices for Optical Communication |
I01574 |
1982 |
eBook |
|
518 |
Trishenkov, M.A |
Detection of Low-Level Optical Signals |
I01531 |
1997 |
eBook |
|
519 |
Thong, John T.L |
Electron Beam Testing Technology |
I01507 |
1993 |
eBook |
|
520 |
Ibach, Harald |
Electron Energy Loss Spectrometers |
I01438 |
1991 |
eBook |
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511.
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Title | Semiconductor Alloys : Physics and Materials Engineering |
Author(s) | An-Ben Chen;Sher, Arden |
Publication | New York, NY, Springer US, 1995. |
Description | 364 p : online resource |
Abstract Note | In the first comprehensive treatment of these technologically important materials, the authors provide theories linking the properties of semiconductor alloys to their constituent compounds. Topics include crystal structures, bonding, elastic properties, phase diagrams, band structures, transport, ab-initio theories, and semi-empirical theories. Each chapter includes extensive tables and figures as well as problem sets |
ISBN,Price | 9781461303176 |
Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
7. ELECTRICAL ENGINEERING
8. Electronic materials
9. MICROSCOPY
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. SOLID STATE PHYSICS
13. SPECTROSCOPY
14. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01767 |
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On Shelf |
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513.
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Title | Semiconductor Physical Electronics |
Author(s) | Li, Sheng S |
Publication | New York, NY, Springer US, 1993. |
Description | 528 p : online resource |
Abstract Note | The purpose of this book is to provide the reader with a self-contained treatment of fundamen?? tal solid state and semiconductor device physics. The material presented in the text is based upon the lecture notes of a one-year graduate course sequence taught by this author for many years in the ??Department of Electrical Engineering of the University of Florida. It is intended as an introductory textbook for graduate students in electrical engineering. However, many students from other disciplines and backgrounds such as chemical engineering, materials science, and physics have also taken this course sequence, and will be interested in the material presented herein. This book may also serve as a general reference for device engineers in the semiconductor industry. The present volume covers a wide variety of topics on basic solid state physics and physical principles of various semiconductor devices. The main subjects covered include crystal structures, lattice dynamics, semiconductor statistics, energy band theory, excess carrier phenomena and recombination mechanisms, carrier transport and scattering mechanisms, optical properties, photoelectric effects, metal-semiconductor devices, the p--n junction diode, bipolar junction transistor, MOS devices, photonic devices, quantum effect devices, and high?? speed III-V semiconductor devices. The text presents a unified and balanced treatment of the physics of semiconductor materials and devices. It is intended to provide physicists and mat?? erials scientists with more device backgrounds, and device engineers with a broader knowledge of fundamental solid state physics |
ISBN,Price | 9781461304890 |
Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
7. ELECTRICAL ENGINEERING
8. Electronic materials
9. MICROSCOPY
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. SOLID STATE PHYSICS
13. SPECTROSCOPY
14. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01653 |
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On Shelf |
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514.
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Title | Semiconductor Physics : An Introduction |
Author(s) | Seeger, Karlheinz |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1991. |
Description | XIV, 504 p : online resource |
Abstract Note | Televisions, telephones, watches, calculators, robots, airplanes and space vehicles all depend on silicon chips. Life as we know it would hardly be possible without semiconductor devices. An understanding of how these devices work requires a detailed knowledge of the physics of semiconductors, including charge transport and the emission and absorption of electromagnetic waves. This book may serve both as a university textbook and as a reference for research and microelectronics engineering. Each section of the book begins with a description of an experiment. The theory is then developed as far as necessary to understand the experimental results. Everyone with high-school mathematics should be able to follow the calculations. The band structure calculations for the diamond and zinc blende types of lattice are supplemented with a personal computer program. Semiconductor physics developed most rapidly in the two decades following the invention of the transistor, and naturally most of the references date from this time. But recent developments such as the Gunn effect, the acoustoelectric effect, superlattices, quantum well structures, and the quantum Hall effect are also discussed. The exercises provided (answers to which are available) will greatly assist the student in consolidating the material presented. From the reviews:"This book is a must for any theoretical and experimental physicist working in the area of semiconductor physics." #Physicalia#1 |
ISBN,Price | 9783662026632 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. ELECTRONICS
5. Electronics and Microelectronics, Instrumentation
6. Materials???Surfaces
7. MICROELECTRONICS
8. Optical and Electronic Materials
9. OPTICAL MATERIALS
10. Surfaces and Interfaces, Thin Films
11. THIN FILMS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01594 |
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On Shelf |
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515.
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Title | Techniques and Concepts of High-Energy Physics VIII |
Author(s) | Ferbel, Thomas |
Publication | New York, NY, Springer US, 1995. |
Description | IX, 220 p : online resource |
Abstract Note | For the eighth Advanced Study Institute (ASI) on Techniques and Concepts of High-Energy Physics we returned once again to the Hotel on the Cay on that speck of land in the harbor of Christiansted, St. Croix, U. S. Virgin Islands. This time, the ASI brought together a total of 73 participants, from 21 countries. The primary support for the meeting was provided, as usual, by the Scientific Affairs Division of the North Atlantic Treaty Organization (NATO). The ASI was cosponsored by the U. S. Department of Energy, by the Fermi National Accelerator Laboratory (Fermilab), by the U. S. National Science Foundation, and by the University of Rochester. A special contribution from the Oliver S. and Jennie R. Donaldson Charitable Trust provided an important degree of flexibility, as well as support for worthy students from developing countries. In addition, the International Science Foundation contributed very generously to the support of a participant from Russia. As in the case of the previous ASls, the scientific program was designed for advanced graduate students and recent PhD recipients in experimental particle physics. The present volume of lectures, although, unfortunately, short of three contributions, should complement the material published in the first seven ASIs, and prove to be of value to a wider audience of physicists. It is a pleasure to acknowledge the encouragement and support that I have continued to receive from colleagues and friends in organizing this meeting |
ISBN,Price | 9781461519171 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. ELECTRICAL ENGINEERING
4. Electronic materials
5. Heavy ions
6. MATHEMATICAL PHYSICS
7. NUCLEAR PHYSICS
8. Nuclear Physics, Heavy Ions, Hadrons
9. Optical and Electronic Materials
10. OPTICAL MATERIALS
11. Theoretical, Mathematical and Computational Physics
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01582 |
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On Shelf |
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516.
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Title | Electron Spectrum of Gapless Semiconductors |
Author(s) | Tsidilkovski, J |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1997. |
Description | IX, 249 p : online resource |
Abstract Note | Electron Spectrum of Gapless Semiconductors presents the peculiarities of physical properties of a comparatively new class of solids - gapless semiconductors (GS). These peculiarities are determined by the main feature of the elctron spectrum, namely the absence of a gap between the conduction and valence bands. GSs form a boundary between metals and semiconductors. On the other hand GSs are of practical interest since they are very sensitive to impurities, and to the influence of light, magnetic and electric fields, and pressure |
ISBN,Price | 9783642604034 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Optical and Electronic Materials
5. OPTICAL MATERIALS
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01577 |
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On Shelf |
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518.
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Title | Detection of Low-Level Optical Signals : Photodetectors, Focal Plane Arrays and Systems |
Author(s) | Trishenkov, M.A |
Publication | Dordrecht, Springer Netherlands, 1997. |
Description | XXII, 458 p : online resource |
Abstract Note | This book is addressed to designers of photodetectors and photodetecting systems, designers of focal plane arrays, charge-coupled devices, specialists in IR technologies, designers of optoelectronic detecting, guiding and tracking systems, systems for IR direction finders, lidars, lightwave communication systems, IR imagers. All these specialists are united by one common purpose: they are all striving to catch the weakest possible optical signal. The most important characteristic of photosensitive devices is their detectivity, which determines the lowest level of optical signal they are able to detect above the noise level. These threshold characteristics define the most important tactical and technical parameters of the entire optoelectronic system, such as its range, resolution, precision. The threshold characteristics of optoelectronic system depend on many of its components; all designers agree, however, that the critically responsible part of the system is the photodetector [1]. By the end of the 1960s the physicists and the engineers were able to overcome many obstacles and to create photodetectors (at least single-element or few-element ones) which covered all the main optical bands (0. 4 . . . 2,2 . . . 3, 3 . . . 5,8 . . . 14 J. . Lm), carried out the detection almost without any loss (the quantum yield being as high as 0. 7 . . . 0. 9), and reduced the noise level to the lowest possible limit |
ISBN,Price | 9789401512909 |
Keyword(s) | 1. Automotive engineering
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRICAL ENGINEERING
5. Electronic materials
6. Image Processing and Computer Vision
7. LASERS
8. Optical and Electronic Materials
9. OPTICAL DATA PROCESSING
10. OPTICAL MATERIALS
11. Optics, Lasers, Photonics, Optical Devices
12. PHOTONICS
|
Item Type | eBook |
Multi-Media Links
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Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01531 |
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On Shelf |
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519.
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Title | Electron Beam Testing Technology |
Author(s) | Thong, John T.L |
Publication | New York, NY, Springer US, 1993. |
Description | XVI, 462 p : online resource |
Abstract Note | Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age |
ISBN,Price | 9781489915221 |
Keyword(s) | 1. CONDENSED MATTER
2. CONDENSED MATTER PHYSICS
3. CRYSTALLOGRAPHY
4. Crystallography and Scattering Methods
5. EBOOK
6. EBOOK - SPRINGER
7. ELECTRICAL ENGINEERING
8. Electronic materials
9. MICROSCOPY
10. Optical and Electronic Materials
11. OPTICAL MATERIALS
12. SOLID STATE PHYSICS
13. SPECTROSCOPY
14. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01507 |
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On Shelf |
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520.
| |
Title | Electron Energy Loss Spectrometers : The Technology of High Performance |
Author(s) | Ibach, Harald |
Publication | Berlin, Heidelberg, Springer Berlin Heidelberg, 1991. |
Description | VIII, 181 p. 2 illus : online resource |
Abstract Note | Electron energy loss spectroscopy has become an indispensable tool in surface analysis. Although the basic physics of this technique is well understood, instrument design has previously largely been left to intuition. This book is the first to provide a comprehensive treatment of the electron optics involved in the production of intense monochromatic beams and the detection of scattered electrons. It includes a full three-dimensional analysis of the electron optical properties of electron emission systems, monochromators and lens systems, placing particular emphasis on the procedures for matching the various components. The description is kept mathematically simple and focuses on practical aspects, with many hints for writing computer codes to calculate and optimize electrostatic lens elements |
ISBN,Price | 9783540471578 |
Keyword(s) | 1. EBOOK
2. EBOOK - SPRINGER
3. Electronic materials
4. Mathematical Methods in Physics
5. MICROSCOPY
6. Numerical and Computational Physics, Simulation
7. Optical and Electronic Materials
8. OPTICAL MATERIALS
9. PHYSICAL CHEMISTRY
10. PHYSICS
11. SOLID STATE PHYSICS
12. SPECTROSCOPY
13. Spectroscopy and Microscopy
|
Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
I01438 |
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On Shelf |
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