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Author | Title | Accn# | Year | Item Type | Claims |
| 31 |
Huang, Songling |
New Technologies in Electromagnetic Non-destructive Testing |
I09771 |
2016 |
eBook |
|
| 32 |
Vesel??, Jozef |
Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms |
I09735 |
2017 |
eBook |
|
| 33 |
Rocca, Mario |
Springer Handbook of Surface Science |
I09728 |
2020 |
eBook |
|
| 34 |
Dick, Rainer |
Advanced Quantum Mechanics |
I09726 |
2020 |
eBook |
|
| 35 |
Cabrera, Mario |
Development of 15 Micron Cutoff Wavelength HgCdTe Detector Arrays for Astronomy |
I09721 |
2020 |
eBook |
|
| 36 |
Smirnov, Boris M |
Atomic Particles and Atom Systems |
I09699 |
2018 |
eBook |
|
| 37 |
Petkov, Plamen |
Advanced Nanotechnologies for Detection and Defence against CBRN Agents |
I09696 |
2018 |
eBook |
|
| 38 |
Nakasako, Masayoshi |
X-Ray Diffraction Imaging of Biological Cells |
I09683 |
2018 |
eBook |
|
| 39 |
Hamaguchi, Chihiro |
Basic Semiconductor Physics |
I09666 |
2017 |
eBook |
|
| 40 |
Ranz, Thomas |
Linear Elasticity of Elastic Circular Inclusions Part 2/Lineare Elastizit??tstheorie bei kreisrunden elastischen Einschl??ssen T |
I09625 |
2020 |
eBook |
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31.
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| Title | New Technologies in Electromagnetic Non-destructive Testing |
| Author(s) | Huang, Songling;Wang, Shen |
| Publication | Singapore, Springer Singapore, 2016. |
| Description | X, 222 p. 193 illus., 146 illus. in color : online resource |
| Abstract Note | This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applications of the electromagnetic NDT technology. It could serve as a valuable reference for college students and relevant NDT technicians. It is also a useful material for qualification training and higher learning for nondestructive testing professionals |
| ISBN,Price | 9789811005787 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. ELECTRONIC CIRCUITS
5. Electronic Circuits and Devices
6. MAGNETIC MATERIALS
7. MAGNETISM
8. Magnetism, Magnetic Materials
9. MATERIALS SCIENCE
10. Measurement Science and Instrumentation
11. Measurement??????
12. MECHANICS
13. Mechanics, Applied
14. PHYSICAL MEASUREMENTS
15. Solid Mechanics
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09771 |
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On Shelf |
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32.
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| Title | Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms |
| Author(s) | Vesel??, Jozef |
| Publication | Cham, Springer International Publishing, 2017. |
| Description | XIV, 100 p. 86 illus., 21 illus. in color : online resource |
| Abstract Note | This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations |
| ISBN,Price | 9783319483023 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. CONDENSED MATTER
3. CONDENSED MATTER PHYSICS
4. EBOOK
5. EBOOK - SPRINGER
6. MATERIALS SCIENCE
7. MICROSCOPY
8. Numerical and Computational Physics, Simulation
9. PHYSICS
10. SPECTROSCOPY
11. Spectroscopy and Microscopy
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09735 |
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On Shelf |
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33.
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| Title | Springer Handbook of Surface Science |
| Author(s) | Rocca, Mario;Rahman, Talat;Vattuone, Luca |
| Publication | Cham, Springer International Publishing, 2020. |
| Description | XXXII, 1260 p. 840 illus. in color : online resource |
| Abstract Note | This handbook delivers an up-to-date, comprehensive and authoritative coverage of the broad field of surface science, encompassing a range of important materials such metals, semiconductors, insulators, ultrathin films and supported nanoobjects. Over 100 experts from all branches of experiment and theory review in 39 chapters all major aspects of solid-state surfaces, from basic principles to applications, including the latest, ground-breaking research results. Beginning with the fundamental background of kinetics and thermodynamics at surfaces, the handbook leads the reader through the basics of crystallographic structures and electronic properties, to the advanced topics at the forefront of current research. These include but are not limited to novel applications in nanoelectronics, nanomechanical devices, plasmonics, carbon films, catalysis, astrochemistry and biology. The handbook is an ideal reference guide and instructional aid for a wide range of physicists, chemists, materials scientists and engineers active throughout academic and industrial research |
| ISBN,Price | 9783030469061 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. CRYSTALLOGRAPHY
3. Crystallography and Scattering Methods
4. EBOOK
5. EBOOK - SPRINGER
6. Interfaces (Physical sciences)
7. MATERIALS SCIENCE
8. Materials???Surfaces
9. Measurement Science and Instrumentation
10. Measurement??????
11. Nanoscale science
12. Nanoscale Science and Technology
13. NANOSCIENCE
14. Nanostructures
15. PHYSICAL MEASUREMENTS
16. Surface and Interface Science, Thin Films
17. Surfaces (Physics)
18. Surfaces and Interfaces, Thin Films
19. THIN FILMS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09728 |
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On Shelf |
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34.
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| Title | Advanced Quantum Mechanics : Materials and Photons |
| Author(s) | Dick, Rainer |
| Publication | Cham, Springer International Publishing, 2020. |
| Description | XXI, 811 p. 64 illus., 42 illus. in color : online resource |
| Abstract Note | This textbook, now in an expanded third edition, emphasizes the importance of advanced quantum mechanics for materials science and all experimental techniques which employ photon absorption, emission, or scattering. Important aspects of introductory quantum mechanics are covered in the first seven chapters to make the subject self-contained and accessible for a wide audience. Advanced Quantum Mechanics: Materials and Photons can therefore be used for advanced undergraduate courses and introductory graduate courses which are targeted towards students with diverse academic backgrounds from the Natural Sciences or Engineering. To enhance this inclusive aspect of making the subject as accessible as possible, introductions to Lagrangian mechanics and the covariant formulation of electrodynamics are provided in appendices. This third edition includes 60 new exercises, new and improved illustrations, and new material on interpretations of quantum mechanics. Other special features include an introduction to Lagrangian field theory and an integrated discussion of transition amplitudes with discrete or continuous initial or final states. Once students have acquired an understanding of basic quantum mechanics and classical field theory, canonical field quantization is easy. Furthermore, the integrated discussion of transition amplitudes naturally leads to the notions of transition probabilities, decay rates, absorption cross sections and scattering cross sections, which are important for all experimental techniques that use photon probes |
| ISBN,Price | 9783030578701 |
| Keyword(s) | 1. Atomic, Molecular, Optical and Plasma Physics
2. ATOMS
3. CONDENSED MATTER
4. CONDENSED MATTER PHYSICS
5. EBOOK
6. EBOOK - SPRINGER
7. LASERS
8. MATERIALS SCIENCE
9. Materials Science, general
10. Optics, Lasers, Photonics, Optical Devices
11. PHOTONICS
12. PHYSICS
13. QUANTUM PHYSICS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09726 |
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On Shelf |
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35.
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| Title | Development of 15 Micron Cutoff Wavelength HgCdTe Detector Arrays for Astronomy |
| Author(s) | Cabrera, Mario |
| Publication | Cham, Springer International Publishing, 2020. |
| Description | XVII, 121 p. 71 illus., 44 illus. in color : online resource |
| Abstract Note | This thesis describes advances in the understanding of HgCdTe detectors. While long wave (15 ??m) infrared detectors HgCdTe detectors have been developed for military use under high background irradiance, these arrays had not previously been developed for astronomical use where the background irradiance is a billion times smaller. The main pitfall in developing such arrays for astronomy is the pixel dark current which plagues long wave HgCdTe. The author details work on the success of shorter wavelength development at Teledyne Imaging Sensors, carefully modeling the dark current???reverse bias voltage curves of their 10 ??m devices at a temperature of 30K, as well as the dark current???temperature curves at several reverse biases, including 250 mV. By projecting first to 13 and then 15 ??m HgCdTe growth, values of fundamental properties of the material that would minimize tunneling dark currents were determined through careful modeling of the dark current-reverse bias voltage curves, as well as the dark current-temperature curves. This analysis was borne out in the 13 ??m parts produced by Teledyne, and then further honed to produce the necessary parameters for the 15 ??m growth. The resulting 13 ??m arrays are being considered by a number of ground-based astronomy research groups |
| ISBN,Price | 9783030542412 |
| Keyword(s) | 1. Astronomy, Observations and Techniques
2. Astronomy???Observations
3. EBOOK
4. EBOOK - SPRINGER
5. MATERIALS SCIENCE
6. Materials Science, general
7. Measurement Science and Instrumentation
8. Measurement??????
9. Observations, Astronomical
10. PHYSICAL MEASUREMENTS
11. SEMICONDUCTORS
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09721 |
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On Shelf |
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36.
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| Title | Atomic Particles and Atom Systems : Data for Properties of Atomic Objects and Processes |
| Author(s) | Smirnov, Boris M |
| Publication | Cham, Springer International Publishing, 2018. |
| Description | VIII, 217 p. 102 illus : online resource |
| Abstract Note | This book presents physical units and widely used physical formulas, which are given together with conversion factors in various units. It includes frequently used atomic spectra and data for atoms, ions and molecules, as well as potential curves for diatomic molecules, and provides numerical parameters for transport phenomena in gases and plasmas. Further, the rate constants of a number of processes in atmospheric ionized air have been added to this second edition of the book. The numerical data has been selected from the information on atoms, atomic systems, atomic processes and models for atomic physics in this area, and the numerical parameters of atoms, ions and atom systems are included in periodical tables of elements |
| ISBN,Price | 9783319754055 |
| Keyword(s) | 1. Atomic, Molecular, Optical and Plasma Physics
2. ATOMS
3. Characterization and Evaluation of Materials
4. EBOOK
5. EBOOK - SPRINGER
6. Engineering Thermodynamics, Heat and Mass Transfer
7. Heat engineering
8. HEAT TRANSFER
9. MASS TRANSFER
10. MATERIALS SCIENCE
11. PHYSICAL CHEMISTRY
12. PHYSICS
13. THERMODYNAMICS
|
| Item Type | eBook |
Multi-Media Links
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Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09699 |
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On Shelf |
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37.
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| Title | Advanced Nanotechnologies for Detection and Defence against CBRN Agents |
| Author(s) | Petkov, Plamen;Tsiulyanu, Dumitru;Popov, Cyril;Kulisch, Wilhelm |
| Publication | Dordrecht, Springer Netherlands, 2018. |
| Description | XIV, 512 p. 269 illus., 117 illus. in color : online resource |
| Abstract Note | This volume gives a broad overview of advanced technologies for detection and defence against chemical, biological, radiological and nuclear (CBRN) agents. It provides chapters addressing the preparation and characterization of different nanoscale materials (metals, oxides, glasses, polymers, carbon-based, etc.) and their applications in fields related to security and safety. In addition, it presents an interdisciplinary approach as the contributors come from different areas of research, such as physics, chemistry, engineering, materials science and biology. A major feature of the book is the combination of longer chapters introducing the basic knowledge on a certain topic, and shorter contributions highlighting specific applications in different security areas |
| ISBN,Price | 9789402412987 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. MATERIALS SCIENCE
5. Nanochemistry
6. Nanoscale science
7. Nanoscale Science and Technology
8. NANOSCIENCE
9. Nanostructures
10. NANOTECHNOLOGY
11. Security Science and Technology
12. System safety
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09696 |
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On Shelf |
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38.
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| Title | X-Ray Diffraction Imaging of Biological Cells |
| Author(s) | Nakasako, Masayoshi |
| Publication | Tokyo, Springer Japan, 2018. |
| Description | XX, 228 p. 96 illus., 89 illus. in color : online resource |
| Abstract Note | In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI |
| ISBN,Price | 9784431566182 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. CRYSTALLOGRAPHY
3. Crystallography and Scattering Methods
4. EBOOK
5. EBOOK - SPRINGER
6. LASERS
7. MATERIALS SCIENCE
8. Measurement Science and Instrumentation
9. Measurement??????
10. Optics, Lasers, Photonics, Optical Devices
11. PHOTONICS
12. PHYSICAL MEASUREMENTS
13. Protein Structure
14. Proteins??
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09683 |
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On Shelf |
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39.
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| Title | Basic Semiconductor Physics |
| Author(s) | Hamaguchi, Chihiro |
| Publication | Cham, Springer International Publishing, 2017. |
| Description | XXI, 709 p. 315 illus : online resource |
| Abstract Note | This book presents a detailed description of basic semiconductor physics. The text covers a wide range of important phenomena in semiconductors, from the simple to the advanced. Four different methods of energy band calculations in the full band region are explained: local empirical pseudopotential, non-local pseudopotential, KP perturbation and tight-binding methods. The effective mass approximation and electron motion in a periodic potential, Boltzmann transport equation and deformation potentials used for analysis of transport properties are discussed. Further, the book examines experiments and theoretical analyses of cyclotron resonance in detail. Optical and transport properties, magneto-transport, two-dimensional electron gas transport (HEMT and MOSFET) and quantum transport are reviewed, while optical transition, electron-phonon interaction and electron mobility are also addressed. Energy and electronic structure of a quantum dot (artificial atom) are explained with the help of Slater determinants. The physics of semiconductor lasers is also described, including Einstein coefficients, stimulated emission, spontaneous emission, laser gain, double heterostructures, blue lasers, optical confinement, laser modes, and strained quantum well lasers, offering insights into the physics of various kinds of semiconductor lasers. In this third edition, energy band calculations in full band zone with spin-orbit interaction are presented, showing all the matrix elements and equipping the reader to prepare computer programs of energy band calculations. The Luttinger Hamiltonian is discussed and used to analyze the valence band structure. Numerical calculations of scattering rate, relaxation time, and mobility are presented for typical semiconductors, which are very helpful for understanding of transport. Nitrides such as GaN, InN, AlN and their ternary alloys are very important materials for the blue light emission, and high power devic es with and high frequency. |
| ISBN,Price | 9783319668604 |
| Keyword(s) | 1. Characterization and Evaluation of Materials
2. EBOOK
3. EBOOK - SPRINGER
4. Electronic materials
5. ELECTRONICS
6. Electronics and Microelectronics, Instrumentation
7. MATERIALS SCIENCE
8. MICROELECTRONICS
9. Optical and Electronic Materials
10. OPTICAL MATERIALS
11. SEMICONDUCTORS
|
| Item Type | eBook |
Multi-Media Links
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| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09666 |
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On Shelf |
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40.
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| Title | Linear Elasticity of Elastic Circular Inclusions Part 2/Lineare Elastizit??tstheorie bei kreisrunden elastischen Einschl??ssen Teil 2 |
| Author(s) | Ranz, Thomas |
| Publication | Cham, Springer International Publishing, 2020. |
| Description | XVII, 100 p. 43 illus., 7 illus. in color : online resource |
| Abstract Note | In this book the real analytic solutions for the ???Disc with Circular Inclusion??? under normal- and shear force at plane-strain state (EVZ) are presented. The associated solution process, which was developed according to the principle of statically indeterminate systems, is documented extensively. The solutions are given in terms of mechanical quantities (deformations, strains and stresses). Due to the superposition of the solutions for normal force in x- and y-direction and shear force the plane strain-stress relation can be formulated. The validation of the real analytic solutions is carried out by numeric FEM solution results. Comparing the results of the finite and infinite disc there is, however, a very high correspondence of all mechanical quantities. Therefore it can be assumed the real analytical solutions are the exact solutions |
| ISBN,Price | 9783030628529 |
| Keyword(s) | 1. Classical and Continuum Physics
2. Continuum physics
3. EBOOK
4. EBOOK - SPRINGER
5. MATERIALS SCIENCE
6. Materials Science, general
|
| Item Type | eBook |
Multi-Media Links
Please Click here for eBook
Circulation Data
| Accession# | |
Call# | Status | Issued To | Return Due On | Physical Location |
| I09625 |
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On Shelf |
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